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			22 lines
		
	
	
		
			673 B
		
	
	
	
		
			C
		
	
	
	
	
	
		
		
			
		
	
	
			22 lines
		
	
	
		
			673 B
		
	
	
	
		
			C
		
	
	
	
	
	
|   | #include "param_test.h"
 | ||
|  | #include "esp_log.h"
 | ||
|  | 
 | ||
|  | void test_serializer(const param_group_t *param_group, const ptest_func_t* test_func) | ||
|  | { | ||
|  |     ESP_LOGI("test", "run test: %s", param_group->name); | ||
|  |     //in this test case, we want to make two devices as similar as possible, so use the same context
 | ||
|  |     void *context = NULL; | ||
|  |     test_func->pre_test(&context); | ||
|  | 
 | ||
|  |     void *pset = param_group->param_group; | ||
|  |     for (int i = param_group->pset_num; i >0; i--) { | ||
|  |         if (test_func->def_param) test_func->def_param(pset); | ||
|  |         test_func->loop(pset, context); | ||
|  |         pset+=param_group->pset_size; | ||
|  |     } | ||
|  | 
 | ||
|  |     test_func->post_test(context); | ||
|  |     free(context); | ||
|  |     context = NULL; | ||
|  | } |