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add a test to verify SPI_FLASH_ENABLE_COUNTERS feature

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This commit is contained in:
wanlei
2023-03-30 20:09:06 +08:00
parent 542a61b6cb
commit 500aab6618
4 changed files with 85 additions and 19 deletions
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12
components/spi_flash/test_apps/esp_flash/main/test_app_main.c
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@@ -11,22 +11,14 @@
// Some resources are lazy allocated in flash encryption, the threadhold is left for that case
#define TEST_MEMORY_LEAK_THRESHOLD (400)
static size_t before_free_8bit;
static size_t before_free_32bit;
void setUp(void)
{
before_free_8bit = heap_caps_get_free_size(MALLOC_CAP_8BIT);
before_free_32bit = heap_caps_get_free_size(MALLOC_CAP_32BIT);
unity_utils_record_free_mem();
}
void tearDown(void)
{
size_t after_free_8bit = heap_caps_get_free_size(MALLOC_CAP_8BIT);
size_t after_free_32bit = heap_caps_get_free_size(MALLOC_CAP_32BIT);
unity_utils_check_leak(before_free_8bit, after_free_8bit, "8BIT", TEST_MEMORY_LEAK_THRESHOLD);
unity_utils_check_leak(before_free_32bit, after_free_32bit, "32BIT", TEST_MEMORY_LEAK_THRESHOLD);
unity_utils_evaluate_leaks_direct(TEST_MEMORY_LEAK_THRESHOLD);
}
void app_main(void)

81
components/spi_flash/test_apps/esp_flash/main/test_esp_flash_drv.c
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@@ -916,6 +916,83 @@ static void test_flash_read_large_psram_buffer_low_internal_mem(const esp_partit
}
TEST_CASE_FLASH("esp_flash_read large PSRAM buffer low memory", test_flash_read_large_psram_buffer_low_internal_mem);
#endif
#if CONFIG_SPI_FLASH_ENABLE_COUNTERS
#define TEST_CNT_RW_TIMES 4
#define TEST_CNT_RW_LEN 64
#define TEST_CNT_ERASE_LEN 8192
void test_flash_counter(const esp_partition_t* part)
{
esp_flash_t* chip = part->flash_chip;
uint32_t offs = part->address;
esp_flash_counters_t flash_counter;
static uint8_t write_buf[TEST_CNT_RW_LEN * TEST_CNT_RW_TIMES];
static uint8_t read_buf[TEST_CNT_RW_LEN * TEST_CNT_RW_TIMES];
for(int i = 0;i < TEST_CNT_RW_LEN * TEST_CNT_RW_TIMES; i ++){
write_buf[i] = i;
}
esp_flash_reset_counters();
flash_counter = *esp_flash_get_counters();
// check for resset_counter and get_counter API
TEST_ASSERT_EACH_EQUAL_HEX8(0, &flash_counter, sizeof(esp_flash_counters_t));
TEST_ASSERT_EQUAL(ESP_OK, esp_flash_erase_region(chip, offs, TEST_CNT_ERASE_LEN));
flash_counter = *esp_flash_get_counters();
// check for erase_counter API
TEST_ASSERT_EQUAL_UINT32(0, flash_counter.read.count);
TEST_ASSERT_EQUAL_UINT32(0, flash_counter.write.count);
TEST_ASSERT_EQUAL_UINT32(1, flash_counter.erase.count);
TEST_ASSERT_EQUAL_UINT32(0 * TEST_CNT_RW_LEN, flash_counter.read.bytes);
TEST_ASSERT_EQUAL_UINT32(0 * TEST_CNT_RW_LEN, flash_counter.write.bytes);
TEST_ASSERT_EQUAL_UINT32(TEST_CNT_ERASE_LEN, flash_counter.erase.bytes);
int count;
for(count = 0; count < TEST_CNT_RW_TIMES; count ++) {
// check counter on write option
TEST_ASSERT_EQUAL(ESP_OK, esp_flash_write(chip, write_buf + TEST_CNT_RW_LEN * count, offs + TEST_CNT_RW_LEN * count, TEST_CNT_RW_LEN) );
flash_counter = *esp_flash_get_counters();
TEST_ASSERT_EQUAL_UINT32((count + 1), flash_counter.write.count);
TEST_ASSERT_EQUAL_UINT32((count + 1) * TEST_CNT_RW_LEN, flash_counter.write.bytes);
// check counter on read option
TEST_ASSERT_EQUAL(ESP_OK, esp_flash_read(chip, read_buf + TEST_CNT_RW_LEN * count, offs + TEST_CNT_RW_LEN * count, TEST_CNT_RW_LEN) );
flash_counter = *esp_flash_get_counters();
TEST_ASSERT_EQUAL_UINT32((count + 1), flash_counter.read.count);
TEST_ASSERT_EQUAL_UINT32((count + 1) * TEST_CNT_RW_LEN, flash_counter.read.bytes);
esp_flash_dump_counters(stdout);
}
TEST_ASSERT_EQUAL_HEX8_ARRAY(write_buf, read_buf, TEST_CNT_RW_LEN * TEST_CNT_RW_TIMES);
// check remain value
flash_counter = *esp_flash_get_counters();
TEST_ASSERT_EQUAL_UINT32(1, flash_counter.erase.count);
TEST_ASSERT_EQUAL_UINT32(TEST_CNT_ERASE_LEN, flash_counter.erase.bytes);
esp_flash_reset_counters();
flash_counter = *esp_flash_get_counters();
// check for resset_counter after used
TEST_ASSERT_EACH_EQUAL_HEX8(0, &flash_counter, sizeof(esp_flash_counters_t));
TEST_ASSERT_EQUAL(ESP_OK, esp_flash_write_encrypted(chip, offs, write_buf, TEST_CNT_RW_LEN) );
TEST_ASSERT_EQUAL(ESP_OK, esp_flash_read_encrypted(chip, offs, read_buf, TEST_CNT_RW_LEN) );
printf("\ntest for encrypted write/read\n");
esp_flash_dump_counters(stdout);
flash_counter = *esp_flash_get_counters();
// As we do one time of encrypted RW, no erase option
TEST_ASSERT_EQUAL_UINT32(1, flash_counter.read.count);
TEST_ASSERT_EQUAL_UINT32(1, flash_counter.write.count);
TEST_ASSERT_EQUAL_UINT32(0, flash_counter.erase.count);
TEST_ASSERT_EQUAL_UINT32(1 * TEST_CNT_RW_LEN, flash_counter.read.bytes);
TEST_ASSERT_EQUAL_UINT32(1 * TEST_CNT_RW_LEN, flash_counter.write.bytes);
TEST_ASSERT_EQUAL_UINT32(0, flash_counter.erase.bytes);
}
TEST_CASE_FLASH("SPI flash counter test", test_flash_counter);
#endif //CONFIG_SPI_FLASH_ENABLE_COUNTERS

10
components/spi_flash/test_apps/esp_flash/pytest_esp_flash.py
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@@ -16,14 +16,12 @@ from pytest_embedded import Dut
[
'release',
'flash_qio',
'verify'
'verify',
],
indirect=True,
)
def test_esp_flash(dut: Dut) -> None:
dut.expect_exact('Press ENTER to see the list of tests')
dut.write('[esp_flash]')
dut.expect_unity_test_output()
dut.run_all_single_board_cases(group='esp_flash')
@pytest.mark.esp32s3
@@ -38,9 +36,7 @@ def test_esp_flash(dut: Dut) -> None:
indirect=True,
)
def test_esp_flash_rom(dut: Dut) -> None:
dut.expect_exact('Press ENTER to see the list of tests')
dut.write('[esp_flash]')
dut.expect_unity_test_output()
dut.run_all_single_board_cases(group='esp_flash')
@pytest.mark.esp32

1
components/spi_flash/test_apps/esp_flash/sdkconfig.ci.release
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@@ -3,3 +3,4 @@ CONFIG_FREERTOS_USE_TICKLESS_IDLE=y
CONFIG_COMPILER_OPTIMIZATION_SIZE=y
CONFIG_BOOTLOADER_COMPILER_OPTIMIZATION_SIZE=y
CONFIG_COMPILER_OPTIMIZATION_ASSERTIONS_SILENT=y
CONFIG_SPI_FLASH_ENABLE_COUNTERS=y