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esp_flash_test: improve unit test
From now on, we have two tags for esp_flash tests: - [esp_flash] for main flash chip only tests - [esp_flash_3] for tests with external flash chips To Run all tests, type `[esp_flash`; to run tests for main flash chip only, type `[esp_flash].
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@@ -113,10 +113,10 @@ typedef void (*flash_test_func_t)(const esp_partition_t *part);
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#define FLASH_TEST_CASE_3_IGNORE(STR, FUNCT_TO_RUN)
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#define FLASH_TEST_CASE_3_IGNORE(STR, FUNCT_TO_RUN)
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#else
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#else
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#define FLASH_TEST_CASE_3(STR, FUNC_TO_RUN) \
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#define FLASH_TEST_CASE_3(STR, FUNC_TO_RUN) \
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TEST_CASE(STR", 3 chips", "[esp_flash][test_env=UT_T1_ESP_FLASH]") {flash_test_func(FUNC_TO_RUN, TEST_CONFIG_NUM);}
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TEST_CASE(STR", 3 chips", "[esp_flash_3][test_env=UT_T1_ESP_FLASH]") {flash_test_func(FUNC_TO_RUN, TEST_CONFIG_NUM);}
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#define FLASH_TEST_CASE_3_IGNORE(STR, FUNC_TO_RUN) \
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#define FLASH_TEST_CASE_3_IGNORE(STR, FUNC_TO_RUN) \
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TEST_CASE(STR", 3 chips", "[esp_flash][test_env=UT_T1_ESP_FLASH][ignore]") {flash_test_func(FUNC_TO_RUN, TEST_CONFIG_NUM);}
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TEST_CASE(STR", 3 chips", "[esp_flash_3][test_env=UT_T1_ESP_FLASH][ignore]") {flash_test_func(FUNC_TO_RUN, TEST_CONFIG_NUM);}
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#endif
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#endif
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//currently all the configs are the same with esp_flash_spi_device_config_t, no more information required
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//currently all the configs are the same with esp_flash_spi_device_config_t, no more information required
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@@ -801,7 +801,7 @@ TEST_CASE("SPI flash test reading with all speed/mode permutations", "[esp_flash
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}
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}
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#ifndef CONFIG_SPIRAM
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#ifndef CONFIG_SPIRAM
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TEST_CASE("SPI flash test reading with all speed/mode permutations, 3 chips", "[esp_flash][test_env=UT_T1_ESP_FLASH]")
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TEST_CASE("SPI flash test reading with all speed/mode permutations, 3 chips", "[esp_flash_3][test_env=UT_T1_ESP_FLASH]")
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{
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{
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for (int i = 0; i < TEST_CONFIG_NUM; i++) {
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for (int i = 0; i < TEST_CONFIG_NUM; i++) {
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test_permutations_chip(&config_list[i]);
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test_permutations_chip(&config_list[i]);
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