From 98ec583690f9030d58018690ea2a71464e62bb32 Mon Sep 17 00:00:00 2001 From: gaoxu Date: Wed, 29 Nov 2023 14:30:25 +0800 Subject: [PATCH] ci(adc): add a test that adc continuous read after restarting --- .../test_apps/adc/main/test_adc_driver.c | 62 +++++++++++++++++++ 1 file changed, 62 insertions(+) diff --git a/components/esp_adc/test_apps/adc/main/test_adc_driver.c b/components/esp_adc/test_apps/adc/main/test_adc_driver.c index e646019ac1..d4284ce2da 100644 --- a/components/esp_adc/test_apps/adc/main/test_adc_driver.c +++ b/components/esp_adc/test_apps/adc/main/test_adc_driver.c @@ -131,6 +131,68 @@ TEST_CASE("ADC oneshot fast work with ISR", "[adc_oneshot]") } #if SOC_ADC_DMA_SUPPORTED + +#if (SOC_ADC_DIGI_RESULT_BYTES == 2) +#define ADC_DRIVER_TEST_OUTPUT_TYPE ADC_DIGI_OUTPUT_FORMAT_TYPE1 +#define ADC_DRIVER_TEST_GET_CHANNEL(p_data) ((p_data)->type1.channel) +#define ADC_DRIVER_TEST_GET_DATA(p_data) ((p_data)->type1.data) +#else +#define ADC_DRIVER_TEST_OUTPUT_TYPE ADC_DIGI_OUTPUT_FORMAT_TYPE2 +#define ADC_DRIVER_TEST_GET_CHANNEL(p_data) ((p_data)->type2.channel) +#define ADC_DRIVER_TEST_GET_DATA(p_data) ((p_data)->type2.data) +#endif + +#if !CONFIG_IDF_TARGET_ESP32C3 //TODO: DIG-270 + +#define ADC_RESTART_TEST_SIZE 4096 +#define ADC_READ_TEST_COUNT 10 + +TEST_CASE("ADC continuous test after restarting", "[adc_continuous]") +{ + adc_continuous_handle_t handle = NULL; + adc_continuous_handle_cfg_t adc_config = { + .max_store_buf_size = ADC_RESTART_TEST_SIZE, + .conv_frame_size = ADC_RESTART_TEST_SIZE, + }; + TEST_ESP_OK(adc_continuous_new_handle(&adc_config, &handle)); + + adc_continuous_config_t dig_cfg = { + .sample_freq_hz = 50 * 1000, + .conv_mode = ADC_CONV_SINGLE_UNIT_1, + .format = ADC_DRIVER_TEST_OUTPUT_TYPE, + }; + adc_digi_pattern_config_t adc_pattern[SOC_ADC_PATT_LEN_MAX] = {0}; + adc_pattern[0].atten = ADC_ATTEN_DB_12; + adc_pattern[0].channel = ADC1_TEST_CHAN0; + adc_pattern[0].unit = ADC_UNIT_1; + adc_pattern[0].bit_width = SOC_ADC_DIGI_MAX_BITWIDTH; + dig_cfg.adc_pattern = adc_pattern; + dig_cfg.pattern_num = 1; + TEST_ESP_OK(adc_continuous_config(handle, &dig_cfg)); + + uint8_t* result = malloc(ADC_RESTART_TEST_SIZE); + TEST_ASSERT(result); + + test_adc_set_io_level(ADC_UNIT_1, ADC1_TEST_CHAN0, 0); + + for (int i = 0; i < ADC_READ_TEST_COUNT; i++) { + uint32_t ret_num = 0; + TEST_ESP_OK(adc_continuous_start(handle)); + TEST_ESP_OK(adc_continuous_read(handle, result, ADC_RESTART_TEST_SIZE, &ret_num, ADC_MAX_DELAY)); + TEST_ASSERT_EQUAL(ADC_RESTART_TEST_SIZE, ret_num); + for (int i = 0; i < ret_num; i += SOC_ADC_DIGI_RESULT_BYTES) { + adc_digi_output_data_t *p = (void*)&result[i]; + uint32_t chan_num = ADC_DRIVER_TEST_GET_CHANNEL(p); + TEST_ASSERT(chan_num < SOC_ADC_CHANNEL_NUM(ADC_UNIT_1)); + } + TEST_ESP_OK(adc_continuous_stop(handle)); + } + + TEST_ESP_OK(adc_continuous_deinit(handle)); + free(result); +} +#endif //!CONFIG_IDF_TARGET_ESP32C3 + #if SOC_ADC_DIG_IIR_FILTER_SUPPORTED TEST_CASE("ADC filter exhausted allocation", "[adc_oneshot]") {