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ci(esp_tee): Enable the TEE test-apps for ESP32-C5

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This commit is contained in:
Laukik Hase
2025-07-23 14:34:15 +05:30
parent ab8400df4a
commit bb55b0cefc
13 changed files with 267 additions and 178 deletions
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8
components/esp_tee/test_apps/.build-test-rules.yml
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@@ -2,10 +2,10 @@
components/esp_tee/test_apps/tee_cli_app: components/esp_tee/test_apps/tee_cli_app:
disable: disable:
- if: IDF_TARGET not in ["esp32c6"] - if: IDF_TARGET not in ["esp32c6", "esp32c5"]
reason: only supported with esp32c6 for now reason: only supported with c6 and c5
components/esp_tee/test_apps/tee_test_fw: components/esp_tee/test_apps/tee_test_fw:
disable: disable:
- if: IDF_TARGET not in ["esp32c6", "esp32h2"] - if: IDF_TARGET not in ["esp32c6", "esp32h2", "esp32c5"]
reason: only supported with esp32c6 and esp32h2 for now reason: only supported with c6, h2 and c5

4
components/esp_tee/test_apps/tee_cli_app/README.md
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@@ -1,5 +1,5 @@
| Supported Targets | ESP32-C6 | | Supported Targets | ESP32-C5 | ESP32-C6 |
| ----------------- | -------- | | ----------------- | -------- | -------- |
# TEE CLI Application: Secure Services Demonstration # TEE CLI Application: Secure Services Demonstration

1
components/esp_tee/test_apps/tee_cli_app/main/tee_srv_ota.c
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@@ -111,7 +111,6 @@ static void tee_ota_task(void *pvParameter)
task_fatal_error(); task_fatal_error();
} else if (data_read > 0) { } else if (data_read > 0) {
if (image_header_was_checked == false) { if (image_header_was_checked == false) {
/* TODO: TEE image header is missing the `esp_app_desc_t` configuration structure */
if (data_read > sizeof(esp_image_header_t) + sizeof(esp_image_segment_header_t)) { if (data_read > sizeof(esp_image_header_t) + sizeof(esp_image_segment_header_t)) {
esp_image_header_t img_hdr; esp_image_header_t img_hdr;
memcpy(&img_hdr, ota_write_data, sizeof(esp_image_header_t)); memcpy(&img_hdr, ota_write_data, sizeof(esp_image_header_t));

52
components/esp_tee/test_apps/tee_cli_app/pytest_tee_cli.py
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@@ -6,11 +6,9 @@ import json
import logging import logging
import multiprocessing import multiprocessing
import os import os
import socket
import ssl import ssl
import time import time
from typing import Any from typing import Any
from typing import Callable
import pexpect import pexpect
import pytest import pytest
@@ -22,7 +20,6 @@ from ecdsa.keys import VerifyingKey
from ecdsa.util import sigdecode_der from ecdsa.util import sigdecode_der
from pytest_embedded import Dut from pytest_embedded import Dut
from pytest_embedded_idf.utils import idf_parametrize from pytest_embedded_idf.utils import idf_parametrize
from RangeHTTPServer import RangeRequestHandler
TEST_MSG = 'hello world' TEST_MSG = 'hello world'
@@ -36,12 +33,12 @@ key_file = os.path.join(os.path.dirname(os.path.abspath(__file__)), 'test_certs/
@pytest.mark.generic @pytest.mark.generic
@idf_parametrize('target', ['esp32c6'], indirect=['target']) @idf_parametrize('target', ['supported_targets'], indirect=['target'])
def test_tee_cli_secure_storage(dut: Dut) -> None: def test_tee_cli_secure_storage(dut: Dut) -> None:
# Dumping the REE binary size # Dumping the REE binary size
binary_file = os.path.join(dut.app.binary_path, 'tee_cli.bin') binary_file = os.path.join(dut.app.binary_path, 'tee_cli.bin')
bin_size = os.path.getsize(binary_file) bin_size = os.path.getsize(binary_file)
logging.info('tee_cli_bin_size : {}KB'.format(bin_size // 1024)) logging.info(f'tee_cli_bin_size : {bin_size // 1024}KB')
# Starting the test # Starting the test
dut.expect('ESP-TEE: Secure services demonstration', timeout=30) dut.expect('ESP-TEE: Secure services demonstration', timeout=30)
@@ -122,12 +119,12 @@ def verify_att_token_signature(att_tk: str) -> Any:
@pytest.mark.generic @pytest.mark.generic
@idf_parametrize('target', ['esp32c6'], indirect=['target']) @idf_parametrize('target', ['supported_targets'], indirect=['target'])
def test_tee_cli_attestation(dut: Dut) -> None: def test_tee_cli_attestation(dut: Dut) -> None:
# Dumping the REE binary size # Dumping the REE binary size
binary_file = os.path.join(dut.app.binary_path, 'tee_cli.bin') binary_file = os.path.join(dut.app.binary_path, 'tee_cli.bin')
bin_size = os.path.getsize(binary_file) bin_size = os.path.getsize(binary_file)
logging.info('tee_cli_bin_size : {}KB'.format(bin_size // 1024)) logging.info(f'tee_cli_bin_size : {bin_size // 1024}KB')
# Starting the test # Starting the test
dut.expect('ESP-TEE: Secure services demonstration', timeout=30) dut.expect('ESP-TEE: Secure services demonstration', timeout=30)
@@ -149,41 +146,22 @@ def test_tee_cli_attestation(dut: Dut) -> None:
####################################### #######################################
def https_request_handler() -> Callable[..., http.server.BaseHTTPRequestHandler]:
"""
Returns a request handler class that handles broken pipe exception
"""
class RequestHandler(RangeRequestHandler):
def finish(self) -> None:
try:
if not self.wfile.closed:
self.wfile.flush()
self.wfile.close()
except socket.error:
pass
self.rfile.close()
def handle(self) -> None:
try:
RangeRequestHandler.handle(self)
except socket.error:
pass
return RequestHandler
def start_https_server(ota_image_dir: str, server_ip: str, server_port: int) -> None: def start_https_server(ota_image_dir: str, server_ip: str, server_port: int) -> None:
os.chdir(ota_image_dir) os.chdir(ota_image_dir)
requestHandler = https_request_handler() server_address = (server_ip, server_port)
httpd = http.server.HTTPServer((server_ip, server_port), requestHandler)
httpd.socket = ssl.wrap_socket(httpd.socket, keyfile=key_file, certfile=server_file, server_side=True) Handler = http.server.SimpleHTTPRequestHandler
httpd = http.server.HTTPServer(server_address, Handler)
context = ssl.SSLContext(ssl.PROTOCOL_TLS_SERVER)
context.load_cert_chain(certfile=server_file, keyfile=key_file)
httpd.socket = context.wrap_socket(httpd.socket, server_side=True)
httpd.serve_forever() httpd.serve_forever()
@pytest.mark.wifi_high_traffic @pytest.mark.wifi_high_traffic
@idf_parametrize('target', ['esp32c6'], indirect=['target']) @idf_parametrize('target', ['supported_targets'], indirect=['target'])
def test_tee_cli_secure_ota_wifi(dut: Dut) -> None: def test_tee_cli_secure_ota_wifi(dut: Dut) -> None:
""" """
This is a positive test case, which downloads complete binary file multiple number of times. This is a positive test case, which downloads complete binary file multiple number of times.
@@ -214,7 +192,7 @@ def test_tee_cli_secure_ota_wifi(dut: Dut) -> None:
# Starting the test # Starting the test
dut.expect('ESP-TEE: Secure services demonstration', timeout=30) dut.expect('ESP-TEE: Secure services demonstration', timeout=30)
time.sleep(1) time.sleep(2)
# Connecting to Wi-Fi # Connecting to Wi-Fi
env_name = 'wifi_high_traffic' env_name = 'wifi_high_traffic'
@@ -225,7 +203,7 @@ def test_tee_cli_secure_ota_wifi(dut: Dut) -> None:
# Fetch the DUT IP address # Fetch the DUT IP address
try: try:
ip_address = dut.expect(r'got ip:(\d+\.\d+\.\d+\.\d+)[^\d]', timeout=30)[1].decode() ip_address = dut.expect(r'got ip:(\d+\.\d+\.\d+\.\d+)[^\d]', timeout=30)[1].decode()
print('Connected to AP/Ethernet with IP: {}'.format(ip_address)) print(f'Connected to AP/Ethernet with IP: {ip_address}')
except pexpect.exceptions.TIMEOUT: except pexpect.exceptions.TIMEOUT:
raise ValueError('ENV_TEST_FAILURE: Cannot connect to AP') raise ValueError('ENV_TEST_FAILURE: Cannot connect to AP')

2
components/esp_tee/test_apps/tee_cli_app/sdkconfig.defaults
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@@ -14,7 +14,7 @@ CONFIG_FREERTOS_UNICORE=y
# TEE: OTA-related # TEE: OTA-related
CONFIG_MBEDTLS_CERTIFICATE_BUNDLE=y CONFIG_MBEDTLS_CERTIFICATE_BUNDLE=y
CONFIG_EXAMPLE_SKIP_COMMON_NAME_CHECK=y CONFIG_EXAMPLE_SKIP_COMMON_NAME_CHECK=y
CONFIG_EXAMPLE_OTA_RECV_TIMEOUT=45000 CONFIG_EXAMPLE_OTA_RECV_TIMEOUT=30000
# Custom certificates for testing # Custom certificates for testing
CONFIG_MBEDTLS_CERTIFICATE_BUNDLE_DEFAULT_CMN=y CONFIG_MBEDTLS_CERTIFICATE_BUNDLE_DEFAULT_CMN=y

43
components/esp_tee/test_apps/tee_cli_app/test_certs/server_cert.pem
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@@ -1,20 +1,27 @@
-----BEGIN CERTIFICATE----- -----BEGIN CERTIFICATE-----
MIIDWDCCAkACCQCbF4+gVh/MLjANBgkqhkiG9w0BAQsFADBuMQswCQYDVQQGEwJJ MIIEmzCCAwOgAwIBAgIUCjRtb8JpjaUnUr1g2JJK8WxzXAkwDQYJKoZIhvcNAQEL
TjELMAkGA1UECAwCTUgxDDAKBgNVBAcMA1BVTjEMMAoGA1UECgwDRVNQMQwwCgYD BQAwTDELMAkGA1UEBhMCSU4xCzAJBgNVBAgMAk1IMQswCQYDVQQHDAJQTjEMMAoG
VQQLDANFU1AxDDAKBgNVBAMMA0VTUDEaMBgGCSqGSIb3DQEJARYLZXNwQGVzcC5j A1UECgwDZXNwMRUwEwYDVQQDDAwxOTIuMTY4LjEuMzYwHhcNMjUwNzI0MTI0OTQw
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TjELMAkGA1UECAwCTUgxDDAKBgNVBAcMA1BVTjEMMAoGA1UECgwDRVNQMQwwCgYD BgNVBAcMAlBOMQwwCgYDVQQKDANlc3AxFTATBgNVBAMMDDE5Mi4xNjguMS4zNjCC
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-----END CERTIFICATE----- -----END CERTIFICATE-----

64
components/esp_tee/test_apps/tee_cli_app/test_certs/server_key.pem
View File

@@ -1,28 +1,40 @@
-----BEGIN PRIVATE KEY----- -----BEGIN PRIVATE KEY-----
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z5udvYufS/lTQWaJRJMCgcEAzxLRrGW3Gz4ch1V+ZCNTNQJqUwHeIQF4mVNkeEk5
wXE2NsW/DqStQiNkNDSMHiTXPfVoHDGhxxKhSYPe2O7JXkJL8EyzwMwEZJ4ypjuV
5/DadZh6cGu6UWVNAzzvcOMnEH8rHFfQlAd7MnFdJafXnEAX9UCfNFHOoNJhBbUj
kQPYVUEkEws0Feu0yUgyDRfDZcxeEC+ubvO0mGZEdGAuvu29AHnnGLhBTTdFb05H
Q4QjfIE8PkLbVa1oC3niOWdo
-----END PRIVATE KEY----- -----END PRIVATE KEY-----

4
components/esp_tee/test_apps/tee_test_fw/README.md
View File

@@ -1,5 +1,5 @@
| Supported Targets | ESP32-C6 | ESP32-H2 | | Supported Targets | ESP32-C5 | ESP32-C6 | ESP32-H2 |
| ----------------- | -------- | -------- | | ----------------- | -------- | -------- | -------- |
## ESP-TEE: Test Suite ## ESP-TEE: Test Suite

51
components/esp_tee/test_apps/tee_test_fw/conftest.py
View File

@@ -10,8 +10,6 @@ import sys
import tempfile import tempfile
from pathlib import Path from pathlib import Path
from typing import Any from typing import Any
from typing import Dict
from typing import List
import espsecure import espsecure
import esptool import esptool
@@ -104,7 +102,48 @@ esp_tee_empty_bin = {
0xDC, 0x60, 0x86, 0x6C, 0x37, 0x76, 0xAA, 0x30, 0x1F, 0x61, 0x48, 0x23, 0xDC, 0x60, 0x86, 0x6C, 0x37, 0x76, 0xAA, 0x30, 0x1F, 0x61, 0x48, 0x23,
0xEA, 0x34, 0xAA, 0x19, 0xE8, 0xDE, 0x04, 0x7D, 0x2A, 0x30, 0xC1, 0xDD, 0xEA, 0x34, 0xAA, 0x19, 0xE8, 0xDE, 0x04, 0x7D, 0x2A, 0x30, 0xC1, 0xDD,
0x61, 0x38, 0x9D, 0xB5, 0xCA, 0x13, 0x5A, 0x79 0x61, 0x38, 0x9D, 0xB5, 0xCA, 0x13, 0x5A, 0x79
] ],
'esp32c5': [
0xE9, 0x04, 0x02, 0x1F, 0x00, 0x00, 0x80, 0x40, 0xEE, 0x00, 0x00, 0x00,
0x17, 0x00, 0x00, 0x64, 0x00, 0xC7, 0x00, 0x00, 0x00, 0x00, 0x00, 0x01,
# DROM segment
0x20, 0x00, 0x00, 0x42, 0x00, 0x02, 0x00, 0x00,
# esp_app_desc structure
0x32, 0x54, 0xCD, 0xAB, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00,
0x00, 0x00, 0x00, 0x00, 0x76, 0x35, 0x2E, 0x35, 0x00, 0x00, 0x00, 0x00,
0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00,
0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00,
0x65, 0x73, 0x70, 0x5F, 0x74, 0x65, 0x65, 0x00, 0x00, 0x00, 0x00, 0x00,
0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00,
0x30, 0x30, 0x3A, 0x30, 0x30, 0x3A, 0x30, 0x30, 0x00, 0x00, 0x00, 0x00,
0x00, 0x00, 0x00, 0x00, 0x4E, 0x6F, 0x76, 0x20, 0x31, 0x31, 0x20, 0x32,
0x30, 0x32, 0x34, 0x00, 0x00, 0x00, 0x00, 0x00, 0x76, 0x35, 0x2E, 0x35,
0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00,
0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00, 0x00,
0x00, 0x00, 0x00, 0x00, 0x2D, 0x63, 0x66, 0x8B, 0x75, 0xFA, 0x59, 0x05,
0x53, 0x34, 0x91, 0x71, 0x51, 0x33, 0x91, 0xDD, 0xF8, 0xB1, 0xFE, 0x83,
0x06, 0xEB, 0x03, 0x80, 0x45, 0xC9, 0x18, 0x20, 0x83, 0x7E, 0x2E, 0x43,
*([0x00] * 0x58),
# Padding
*([0x00] * 0x100),
# IRAM segment
0x00, 0x00, 0x80, 0x40, 0x20, 0x00, 0x00, 0x00,
*([0x00] * 0x20),
# PADDING segment
0x00, 0x00, 0x00, 0x00, 0xC8, 0x7D, 0x00, 0x00,
*([0x00] * 0x7DC8),
# IROM segment
0x20, 0x80, 0x00, 0x42, 0x00, 0x01, 0x00, 0x00,
*([0x00] * 0x100),
# Padding
*([0x00] * 0x0F),
# CRC8 checksum
0x56,
# Image SHA256
0xCD, 0xCC, 0xF2, 0xE3, 0x52, 0x76, 0xE5, 0x6D, 0xF6, 0x32, 0x95, 0x27,
0x5F, 0xF3, 0xD8, 0x90, 0xD7, 0x95, 0xA0, 0x95, 0xD5, 0xDA, 0xE7, 0xA4,
0x58, 0x08, 0x84, 0xBB, 0x8F, 0x29, 0xAB, 0xE4
],
} }
# fmt: on # fmt: on
@@ -233,7 +272,7 @@ class TEESerial(IdfSerial):
self.flash() self.flash()
self.custom_erase_partition('secure_storage') self.custom_erase_partition('secure_storage')
KEY_DEFS: List[Dict[str, Any]] = [ KEY_DEFS: list[dict[str, Any]] = [
{'key': 'aes256_key0', 'type': 'aes256', 'input': None, 'write_once': True}, {'key': 'aes256_key0', 'type': 'aes256', 'input': None, 'write_once': True},
{ {
'key': 'aes256_key1', 'key': 'aes256_key1',
@@ -264,7 +303,7 @@ class TEESerial(IdfSerial):
NVS_CSV_PATH = TMP_DIR / 'tee_sec_stg_val.csv' NVS_CSV_PATH = TMP_DIR / 'tee_sec_stg_val.csv'
NVS_BIN_PATH = TMP_DIR / 'tee_sec_stg_nvs.bin' NVS_BIN_PATH = TMP_DIR / 'tee_sec_stg_nvs.bin'
def run_command(self, command: List[str]) -> None: def run_command(self, command: list[str]) -> None:
try: try:
subprocess.check_call(command, stdout=subprocess.DEVNULL, stderr=subprocess.DEVNULL) subprocess.check_call(command, stdout=subprocess.DEVNULL, stderr=subprocess.DEVNULL)
except subprocess.CalledProcessError: except subprocess.CalledProcessError:
@@ -276,7 +315,7 @@ class TEESerial(IdfSerial):
def create_tee_sec_stg_csv(self, tmp_dir: Path) -> Path: def create_tee_sec_stg_csv(self, tmp_dir: Path) -> Path:
csv_path = self.NVS_CSV_PATH csv_path = self.NVS_CSV_PATH
rows: List[List[str]] = [ rows: list[list[str]] = [
['key', 'type', 'encoding', 'value'], ['key', 'type', 'encoding', 'value'],
['tee_sec_stg_ns', 'namespace', '', ''], ['tee_sec_stg_ns', 'namespace', '', ''],
] ]

50
components/esp_tee/test_apps/tee_test_fw/main/test_esp_tee_flash_prot.c
View File

@@ -22,6 +22,7 @@
#include "unity.h" #include "unity.h"
#include "ccomp_timer.h" #include "ccomp_timer.h"
#include "sdkconfig.h"
#define BOOT_COUNT_NAMESPACE "boot_count" #define BOOT_COUNT_NAMESPACE "boot_count"
#define TEST_PART_LABEL "custom" #define TEST_PART_LABEL "custom"
@@ -29,6 +30,30 @@
#define ESP_TEE_SEC_STG_PART_LABEL "secure_storage" #define ESP_TEE_SEC_STG_PART_LABEL "secure_storage"
__attribute__((unused)) static const uint32_t mmu_op_fail_seq[8] = {[0 ... 7] = 0x0addbad0};
#if CONFIG_IDF_TARGET_ESP32C6 || CONFIG_IDF_TARGET_ESP32H2
#define SOC_TEE_FLASH_OP_FAIL_FAULT 1
#else
#define SOC_TEE_FLASH_OP_FAIL_FAULT 0
#endif
#if SOC_TEE_FLASH_OP_FAIL_FAULT
#define CHECK_MMU_OP_FAIL(ptr_) do {} while (0)
#else
#define CHECK_MMU_OP_FAIL(ptr_) \
do { \
TEST_ASSERT_EQUAL_HEX8_ARRAY(mmu_op_fail_seq, (ptr_), 0x20); \
esp_restart(); \
} while (0)
#endif
#if SOC_TEE_FLASH_OP_FAIL_FAULT
#define CHECK_FLASH_OP_FAIL(err) TEST_ESP_ERR(ESP_FAIL, err)
#else
#define CHECK_FLASH_OP_FAIL(err) do { (void)(err); esp_restart(); } while (0)
#endif
static const char *TAG = "test_esp_tee_flash_prot"; static const char *TAG = "test_esp_tee_flash_prot";
static void set_boot_count_in_nvs(uint8_t boot_count) static void set_boot_count_in_nvs(uint8_t boot_count)
@@ -77,6 +102,7 @@ static void test_esp_partition_mmap_api(void)
part = esp_partition_find_first(ESP_PARTITION_TYPE_APP, ESP_PARTITION_SUBTYPE_APP_TEE_0, NULL); part = esp_partition_find_first(ESP_PARTITION_TYPE_APP, ESP_PARTITION_SUBTYPE_APP_TEE_0, NULL);
TEST_ASSERT_NOT_NULL(part); TEST_ASSERT_NOT_NULL(part);
TEST_ESP_OK(esp_partition_mmap(part, 0, part->size, ESP_PARTITION_MMAP_DATA, &outptr, &out_handle)); TEST_ESP_OK(esp_partition_mmap(part, 0, part->size, ESP_PARTITION_MMAP_DATA, &outptr, &out_handle));
CHECK_MMU_OP_FAIL(outptr);
ESP_LOG_BUFFER_HEXDUMP(TAG, outptr, 0x20, ESP_LOG_INFO); ESP_LOG_BUFFER_HEXDUMP(TAG, outptr, 0x20, ESP_LOG_INFO);
TEST_FAIL_MESSAGE("System fault should have been generated"); TEST_FAIL_MESSAGE("System fault should have been generated");
break; break;
@@ -84,6 +110,7 @@ static void test_esp_partition_mmap_api(void)
part = esp_partition_find_first(ESP_PARTITION_TYPE_APP, ESP_PARTITION_SUBTYPE_APP_TEE_1, NULL); part = esp_partition_find_first(ESP_PARTITION_TYPE_APP, ESP_PARTITION_SUBTYPE_APP_TEE_1, NULL);
TEST_ASSERT_NOT_NULL(part); TEST_ASSERT_NOT_NULL(part);
TEST_ESP_OK(esp_partition_mmap(part, 0, part->size, ESP_PARTITION_MMAP_INST, &outptr, &out_handle)); TEST_ESP_OK(esp_partition_mmap(part, 0, part->size, ESP_PARTITION_MMAP_INST, &outptr, &out_handle));
CHECK_MMU_OP_FAIL(outptr);
ESP_LOG_BUFFER_HEXDUMP(TAG, outptr, 0x20, ESP_LOG_INFO); ESP_LOG_BUFFER_HEXDUMP(TAG, outptr, 0x20, ESP_LOG_INFO);
TEST_FAIL_MESSAGE("System fault should have been generated"); TEST_FAIL_MESSAGE("System fault should have been generated");
break; break;
@@ -91,6 +118,7 @@ static void test_esp_partition_mmap_api(void)
part = esp_partition_find_first(ESP_PARTITION_TYPE_DATA, ESP_PARTITION_SUBTYPE_DATA_TEE_OTA, NULL); part = esp_partition_find_first(ESP_PARTITION_TYPE_DATA, ESP_PARTITION_SUBTYPE_DATA_TEE_OTA, NULL);
TEST_ASSERT_NOT_NULL(part); TEST_ASSERT_NOT_NULL(part);
TEST_ESP_OK(esp_partition_mmap(part, 0, part->size, ESP_PARTITION_MMAP_DATA, &outptr, &out_handle)); TEST_ESP_OK(esp_partition_mmap(part, 0, part->size, ESP_PARTITION_MMAP_DATA, &outptr, &out_handle));
CHECK_MMU_OP_FAIL(outptr);
ESP_LOG_BUFFER_HEXDUMP(TAG, outptr, 0x20, ESP_LOG_INFO); ESP_LOG_BUFFER_HEXDUMP(TAG, outptr, 0x20, ESP_LOG_INFO);
TEST_FAIL_MESSAGE("System fault should have been generated"); TEST_FAIL_MESSAGE("System fault should have been generated");
break; break;
@@ -98,6 +126,7 @@ static void test_esp_partition_mmap_api(void)
part = esp_partition_find_first(ESP_PARTITION_TYPE_DATA, ESP_PARTITION_SUBTYPE_DATA_NVS, ESP_TEE_SEC_STG_PART_LABEL); part = esp_partition_find_first(ESP_PARTITION_TYPE_DATA, ESP_PARTITION_SUBTYPE_DATA_NVS, ESP_TEE_SEC_STG_PART_LABEL);
TEST_ASSERT_NOT_NULL(part); TEST_ASSERT_NOT_NULL(part);
TEST_ESP_OK(esp_partition_mmap(part, 0, part->size, ESP_PARTITION_MMAP_DATA, &outptr, &out_handle)); TEST_ESP_OK(esp_partition_mmap(part, 0, part->size, ESP_PARTITION_MMAP_DATA, &outptr, &out_handle));
CHECK_MMU_OP_FAIL(outptr);
ESP_LOG_BUFFER_HEXDUMP(TAG, outptr, 0x20, ESP_LOG_INFO); ESP_LOG_BUFFER_HEXDUMP(TAG, outptr, 0x20, ESP_LOG_INFO);
TEST_FAIL_MESSAGE("System fault should have been generated"); TEST_FAIL_MESSAGE("System fault should have been generated");
break; break;
@@ -117,7 +146,8 @@ static void test_esp_partition_api_r(const esp_partition_t *part)
TEST_ASSERT_NOT_NULL(part); TEST_ASSERT_NOT_NULL(part);
uint8_t buf_r[128]; uint8_t buf_r[128];
memset(buf_r, 0x00, sizeof(buf_r)); memset(buf_r, 0x00, sizeof(buf_r));
TEST_ESP_ERR(ESP_FAIL, esp_partition_read(part, 0x00, buf_r, sizeof(buf_r))); esp_err_t err = esp_partition_read(part, 0x00, buf_r, sizeof(buf_r));
CHECK_FLASH_OP_FAIL(err);
} }
static void test_esp_partition_api_w(const esp_partition_t *part) static void test_esp_partition_api_w(const esp_partition_t *part)
@@ -125,13 +155,15 @@ static void test_esp_partition_api_w(const esp_partition_t *part)
TEST_ASSERT_NOT_NULL(part); TEST_ASSERT_NOT_NULL(part);
uint8_t buf_w[128]; uint8_t buf_w[128];
memset(buf_w, 0xA5, sizeof(buf_w)); memset(buf_w, 0xA5, sizeof(buf_w));
TEST_ESP_ERR(ESP_FAIL, esp_partition_write(part, 0x00, buf_w, sizeof(buf_w))); esp_err_t err = esp_partition_write(part, 0x00, buf_w, sizeof(buf_w));
CHECK_FLASH_OP_FAIL(err);
} }
static void test_esp_partition_api_e(const esp_partition_t *part) static void test_esp_partition_api_e(const esp_partition_t *part)
{ {
TEST_ASSERT_NOT_NULL(part); TEST_ASSERT_NOT_NULL(part);
TEST_ESP_ERR(ESP_FAIL, esp_partition_erase_range(part, 0x00, SPI_FLASH_SEC_SIZE)); esp_err_t err = esp_partition_erase_range(part, 0x00, SPI_FLASH_SEC_SIZE);
CHECK_FLASH_OP_FAIL(err);
} }
static void test_esp_partition_api(void) static void test_esp_partition_api(void)
@@ -188,6 +220,7 @@ static void test_spi_flash_mmap_api(void)
part = esp_partition_find_first(ESP_PARTITION_TYPE_APP, ESP_PARTITION_SUBTYPE_APP_TEE_0, NULL); part = esp_partition_find_first(ESP_PARTITION_TYPE_APP, ESP_PARTITION_SUBTYPE_APP_TEE_0, NULL);
TEST_ASSERT_NOT_NULL(part); TEST_ASSERT_NOT_NULL(part);
TEST_ESP_OK(spi_flash_mmap(part->address, part->size, SPI_FLASH_MMAP_DATA, &ptr, &handle)); TEST_ESP_OK(spi_flash_mmap(part->address, part->size, SPI_FLASH_MMAP_DATA, &ptr, &handle));
CHECK_MMU_OP_FAIL(ptr);
ESP_LOG_BUFFER_HEXDUMP(TAG, ptr, 0x20, ESP_LOG_INFO); ESP_LOG_BUFFER_HEXDUMP(TAG, ptr, 0x20, ESP_LOG_INFO);
TEST_FAIL_MESSAGE("System fault should have been generated"); TEST_FAIL_MESSAGE("System fault should have been generated");
break; break;
@@ -195,6 +228,7 @@ static void test_spi_flash_mmap_api(void)
part = esp_partition_find_first(ESP_PARTITION_TYPE_APP, ESP_PARTITION_SUBTYPE_APP_TEE_1, NULL); part = esp_partition_find_first(ESP_PARTITION_TYPE_APP, ESP_PARTITION_SUBTYPE_APP_TEE_1, NULL);
TEST_ASSERT_NOT_NULL(part); TEST_ASSERT_NOT_NULL(part);
TEST_ESP_OK(spi_flash_mmap(part->address, part->size, SPI_FLASH_MMAP_INST, &ptr, &handle)); TEST_ESP_OK(spi_flash_mmap(part->address, part->size, SPI_FLASH_MMAP_INST, &ptr, &handle));
CHECK_MMU_OP_FAIL(ptr);
ESP_LOG_BUFFER_HEXDUMP(TAG, ptr, 0x20, ESP_LOG_INFO); ESP_LOG_BUFFER_HEXDUMP(TAG, ptr, 0x20, ESP_LOG_INFO);
TEST_FAIL_MESSAGE("System fault should have been generated"); TEST_FAIL_MESSAGE("System fault should have been generated");
break; break;
@@ -202,6 +236,7 @@ static void test_spi_flash_mmap_api(void)
part = esp_partition_find_first(ESP_PARTITION_TYPE_DATA, ESP_PARTITION_SUBTYPE_DATA_TEE_OTA, NULL); part = esp_partition_find_first(ESP_PARTITION_TYPE_DATA, ESP_PARTITION_SUBTYPE_DATA_TEE_OTA, NULL);
TEST_ASSERT_NOT_NULL(part); TEST_ASSERT_NOT_NULL(part);
TEST_ESP_OK(spi_flash_mmap(part->address, part->size, SPI_FLASH_MMAP_DATA, &ptr, &handle)); TEST_ESP_OK(spi_flash_mmap(part->address, part->size, SPI_FLASH_MMAP_DATA, &ptr, &handle));
CHECK_MMU_OP_FAIL(ptr);
ESP_LOG_BUFFER_HEXDUMP(TAG, ptr, 0x20, ESP_LOG_INFO); ESP_LOG_BUFFER_HEXDUMP(TAG, ptr, 0x20, ESP_LOG_INFO);
TEST_FAIL_MESSAGE("System fault should have been generated"); TEST_FAIL_MESSAGE("System fault should have been generated");
break; break;
@@ -222,19 +257,22 @@ static void test_esp_flash_api_r(uint32_t paddr)
{ {
uint8_t buf_r[128]; uint8_t buf_r[128];
memset(buf_r, 0x00, sizeof(buf_r)); memset(buf_r, 0x00, sizeof(buf_r));
TEST_ESP_ERR(ESP_FAIL, esp_flash_read(NULL, buf_r, paddr, sizeof(buf_r))); esp_err_t err = esp_flash_read(NULL, buf_r, paddr, sizeof(buf_r));
CHECK_FLASH_OP_FAIL(err);
} }
static void test_esp_flash_api_w(uint32_t paddr) static void test_esp_flash_api_w(uint32_t paddr)
{ {
uint8_t buf_w[128]; uint8_t buf_w[128];
memset(buf_w, 0xA5, sizeof(buf_w)); memset(buf_w, 0xA5, sizeof(buf_w));
TEST_ESP_ERR(ESP_FAIL, esp_flash_write(NULL, buf_w, paddr, sizeof(buf_w))); esp_err_t err = esp_flash_write(NULL, buf_w, paddr, sizeof(buf_w));
CHECK_FLASH_OP_FAIL(err);
} }
static void test_esp_flash_api_e(uint32_t paddr) static void test_esp_flash_api_e(uint32_t paddr)
{ {
TEST_ESP_ERR(ESP_FAIL, esp_flash_erase_region(NULL, paddr, SPI_FLASH_SEC_SIZE)); esp_err_t err = esp_flash_erase_region(NULL, paddr, SPI_FLASH_SEC_SIZE);
CHECK_FLASH_OP_FAIL(err);
} }
static void test_esp_flash_api(void) static void test_esp_flash_api(void)

82
components/esp_tee/test_apps/tee_test_fw/main/test_esp_tee_panic.c
View File

@@ -35,102 +35,117 @@ extern uint32_t _instruction_reserved_start;
#define TEST_APM_EFUSE_PROT_REG EFUSE_RD_KEY5_DATA0_REG #define TEST_APM_EFUSE_PROT_REG EFUSE_RD_KEY5_DATA0_REG
#endif #endif
TEST_CASE("Test APM violation interrupt: eFuse", "[apm_violation]") TEST_CASE("Test APM violation: eFuse", "[apm_violation]")
{ {
uint32_t val = UINT32_MAX; uint32_t val = UINT32_MAX;
val = REG_READ(TEST_APM_EFUSE_PROT_REG); val = REG_READ(TEST_APM_EFUSE_PROT_REG);
TEST_ASSERT_EQUAL(0, val); TEST_ASSERT_EQUAL(0, val);
TEST_FAIL_MESSAGE("APM violation interrupt should have been generated"); TEST_FAIL_MESSAGE("APM violation should have been generated");
} }
TEST_CASE("Test APM violation interrupt: MMU", "[apm_violation]") TEST_CASE("Test APM violation: MMU", "[apm_violation]")
{ {
uint32_t val = UINT32_MAX; uint32_t val = UINT32_MAX;
REG_WRITE(SPI_MEM_MMU_ITEM_INDEX_REG(0), SOC_MMU_ENTRY_NUM - 2); REG_WRITE(SPI_MEM_MMU_ITEM_INDEX_REG(0), SOC_MMU_ENTRY_NUM - 2);
val = REG_READ(SPI_MEM_MMU_ITEM_CONTENT_REG(0)); val = REG_READ(SPI_MEM_MMU_ITEM_CONTENT_REG(0));
TEST_ASSERT_EQUAL(0, val); TEST_ASSERT_EQUAL(0, val);
TEST_FAIL_MESSAGE("APM violation interrupt should have been generated"); TEST_FAIL_MESSAGE("APM violation should have been generated");
} }
TEST_CASE("Test APM violation interrupt: AES", "[apm_violation]") TEST_CASE("Test APM violation: AES", "[apm_violation]")
{ {
uint32_t val = UINT32_MAX; uint32_t val = UINT32_MAX;
val = REG_READ(AES_KEY_2_REG); val = REG_READ(AES_KEY_2_REG);
TEST_ASSERT_EQUAL(0, val); TEST_ASSERT_EQUAL(0, val);
TEST_FAIL_MESSAGE("APM violation interrupt should have been generated"); TEST_FAIL_MESSAGE("APM violation should have been generated");
} }
TEST_CASE("Test APM violation interrupt: HMAC", "[apm_violation]") TEST_CASE("Test APM violation: HMAC", "[apm_violation]")
{ {
uint32_t val = UINT32_MAX; uint32_t val = UINT32_MAX;
val = REG_READ(HMAC_SET_PARA_KEY_REG); val = REG_READ(HMAC_SET_PARA_KEY_REG);
TEST_ASSERT_EQUAL(0, val); TEST_ASSERT_EQUAL(0, val);
TEST_FAIL_MESSAGE("APM violation interrupt should have been generated"); TEST_FAIL_MESSAGE("APM violation should have been generated");
} }
TEST_CASE("Test APM violation interrupt: DS", "[apm_violation]") TEST_CASE("Test APM violation: DS", "[apm_violation]")
{ {
uint32_t val = UINT32_MAX; uint32_t val = UINT32_MAX;
val = REG_READ(DS_Z_MEM); val = REG_READ(DS_Z_MEM);
TEST_ASSERT_EQUAL(0, val); TEST_ASSERT_EQUAL(0, val);
TEST_FAIL_MESSAGE("APM violation interrupt should have been generated"); TEST_FAIL_MESSAGE("APM violation should have been generated");
} }
TEST_CASE("Test APM violation interrupt: SHA PCR", "[apm_violation]") TEST_CASE("Test APM violation: SHA PCR", "[apm_violation]")
{ {
uint32_t val = 0; uint32_t val = 0;
REG_WRITE(PCR_SHA_CONF_REG, val); REG_WRITE(PCR_SHA_CONF_REG, val);
TEST_FAIL_MESSAGE("APM violation interrupt should have been generated"); TEST_FAIL_MESSAGE("APM violation should have been generated");
} }
TEST_CASE("Test APM violation interrupt: ECC PCR", "[apm_violation]") TEST_CASE("Test APM violation: ECC PCR", "[apm_violation]")
{ {
uint32_t val = 0; uint32_t val = 0;
REG_WRITE(PCR_ECC_CONF_REG, val); REG_WRITE(PCR_ECC_CONF_REG, val);
TEST_FAIL_MESSAGE("APM violation interrupt should have been generated"); TEST_FAIL_MESSAGE("APM violation should have been generated");
} }
/* TEE IRAM: Reserved/Vector-table boundary */ // NOTE: For C6/H2, SWDT and BOD are protected using PMP, thus this test
TEST_CASE("Test TEE-TEE violation: IRAM (W1)", "[exception]") // generates a store access fault instead of APM violation
TEST_CASE("Test APM violation: SWDT/BOD", "[exception]")
{ {
esp_tee_service_call(1, SS_ESP_TEE_TEST_IRAM_REG1_WRITE_VIOLATION); #if CONFIG_IDF_TARGET_ESP32C6 || CONFIG_IDF_TARGET_ESP32H2
REG_WRITE(LP_ANALOG_PERI_LP_ANA_FIB_ENABLE_REG, 0);
#else
REG_WRITE(LP_ANA_FIB_ENABLE_REG, 0);
#endif
TEST_FAIL_MESSAGE("Exception should have been generated"); TEST_FAIL_MESSAGE("Exception should have been generated");
} }
/* Illegal memory space: Write */ /* Illegal memory space: Write */
TEST_CASE("Test TEE-TEE violation: Reserved (W1)", "[exception]") TEST_CASE("Test TEE-TEE violation: Reserved-W1", "[exception]")
{ {
esp_tee_service_call(1, SS_ESP_TEE_TEST_RESV_REG1_WRITE_VIOLATION); esp_tee_service_call(1, SS_ESP_TEE_TEST_RESV_REG1_WRITE_VIOLATION);
TEST_FAIL_MESSAGE("Exception should have been generated"); TEST_FAIL_MESSAGE("Exception should have been generated");
} }
/* Illegal memory space: Execution */ /* Illegal memory space: Execution */
TEST_CASE("Test TEE-TEE violation: Reserved (X1)", "[exception]") TEST_CASE("Test TEE-TEE violation: Reserved-X1", "[exception]")
{ {
esp_tee_service_call(1, SS_ESP_TEE_TEST_RESV_REG1_EXEC_VIOLATION); esp_tee_service_call(1, SS_ESP_TEE_TEST_RESV_REG1_EXEC_VIOLATION);
TEST_FAIL_MESSAGE("Exception should have been generated"); TEST_FAIL_MESSAGE("Exception should have been generated");
} }
// TODO: [IDF-13827] Enable when TEE SRAM is partitioned as IRAM (RX) and DRAM (RW)
#if !TEMPORARY_DISABLED_FOR_TARGETS(ESP32C5)
/* TEE IRAM: Reserved/Vector-table boundary */
TEST_CASE("Test TEE-TEE violation: IRAM-W1", "[exception]")
{
esp_tee_service_call(1, SS_ESP_TEE_TEST_IRAM_REG1_WRITE_VIOLATION);
TEST_FAIL_MESSAGE("Exception should have been generated");
}
/* TEE IRAM: Vector table region */ /* TEE IRAM: Vector table region */
TEST_CASE("Test TEE-TEE violation: IRAM (W2)", "[exception]") TEST_CASE("Test TEE-TEE violation: IRAM-W2", "[exception]")
{ {
esp_tee_service_call(1, SS_ESP_TEE_TEST_IRAM_REG2_WRITE_VIOLATION); esp_tee_service_call(1, SS_ESP_TEE_TEST_IRAM_REG2_WRITE_VIOLATION);
TEST_FAIL_MESSAGE("Exception should have been generated"); TEST_FAIL_MESSAGE("Exception should have been generated");
} }
/* TEE DRAM: Stack region */ /* TEE DRAM: Stack region */
TEST_CASE("Test TEE-TEE violation: DRAM (X1)", "[exception]") TEST_CASE("Test TEE-TEE violation: DRAM-X1", "[exception]")
{ {
esp_tee_service_call(1, SS_ESP_TEE_TEST_DRAM_REG1_EXEC_VIOLATION); esp_tee_service_call(1, SS_ESP_TEE_TEST_DRAM_REG1_EXEC_VIOLATION);
TEST_FAIL_MESSAGE("Exception should have been generated"); TEST_FAIL_MESSAGE("Exception should have been generated");
} }
/* TEE DRAM: Heap region */ /* TEE DRAM: Heap region */
TEST_CASE("Test TEE-TEE violation: DRAM (X2)", "[exception]") TEST_CASE("Test TEE-TEE violation: DRAM-X2", "[exception]")
{ {
esp_tee_service_call(1, SS_ESP_TEE_TEST_DRAM_REG2_EXEC_VIOLATION); esp_tee_service_call(1, SS_ESP_TEE_TEST_DRAM_REG2_EXEC_VIOLATION);
TEST_FAIL_MESSAGE("Exception should have been generated"); TEST_FAIL_MESSAGE("Exception should have been generated");
} }
#endif
/* Illegal Instruction */ /* Illegal Instruction */
TEST_CASE("Test TEE-TEE violation: Illegal Instruction", "[exception]") TEST_CASE("Test TEE-TEE violation: Illegal Instruction", "[exception]")
@@ -140,7 +155,7 @@ TEST_CASE("Test TEE-TEE violation: Illegal Instruction", "[exception]")
} }
/* TEE DRAM -REE IRAM Boundary */ /* TEE DRAM -REE IRAM Boundary */
TEST_CASE("Test REE-TEE isolation: DRAM (R1)", "[exception]") TEST_CASE("Test REE-TEE isolation: DRAM-R1", "[exception]")
{ {
uint32_t* val = (uint32_t *)(&_iram_start - 0x04); uint32_t* val = (uint32_t *)(&_iram_start - 0x04);
TEST_ASSERT_EQUAL(0, *val); TEST_ASSERT_EQUAL(0, *val);
@@ -148,14 +163,14 @@ TEST_CASE("Test REE-TEE isolation: DRAM (R1)", "[exception]")
} }
/* TEE DRAM -REE IRAM Boundary */ /* TEE DRAM -REE IRAM Boundary */
TEST_CASE("Test REE-TEE isolation: DRAM (W1)", "[exception]") TEST_CASE("Test REE-TEE isolation: DRAM-W1", "[exception]")
{ {
*(uint32_t *)(&_iram_start - 0x04) = 0xbadc0de; *(uint32_t *)(&_iram_start - 0x04) = 0xbadc0de;
TEST_FAIL_MESSAGE("Exception should have been generated"); TEST_FAIL_MESSAGE("Exception should have been generated");
} }
/* TEE IRAM region */ /* TEE IRAM region */
TEST_CASE("Test REE-TEE isolation: IRAM (R1)", "[exception]") TEST_CASE("Test REE-TEE isolation: IRAM-R1", "[exception]")
{ {
uint32_t *val = (uint32_t *)(&_iram_start - (CONFIG_SECURE_TEE_IRAM_SIZE + CONFIG_SECURE_TEE_DRAM_SIZE) + 0x04); uint32_t *val = (uint32_t *)(&_iram_start - (CONFIG_SECURE_TEE_IRAM_SIZE + CONFIG_SECURE_TEE_DRAM_SIZE) + 0x04);
TEST_ASSERT_EQUAL(0, *val); TEST_ASSERT_EQUAL(0, *val);
@@ -163,14 +178,14 @@ TEST_CASE("Test REE-TEE isolation: IRAM (R1)", "[exception]")
} }
/* TEE IRAM region */ /* TEE IRAM region */
TEST_CASE("Test REE-TEE isolation: IRAM (W1)", "[exception]") TEST_CASE("Test REE-TEE isolation: IRAM-W1", "[exception]")
{ {
*(uint32_t *)(&_iram_start - (CONFIG_SECURE_TEE_IRAM_SIZE + CONFIG_SECURE_TEE_DRAM_SIZE) + 0x04) = 0xbadc0de; *(uint32_t *)(&_iram_start - (CONFIG_SECURE_TEE_IRAM_SIZE + CONFIG_SECURE_TEE_DRAM_SIZE) + 0x04) = 0xbadc0de;
TEST_FAIL_MESSAGE("Exception should have been generated"); TEST_FAIL_MESSAGE("Exception should have been generated");
} }
/* TEE IROM region */ /* TEE IROM region */
TEST_CASE("Test REE-TEE isolation: IROM (R1)", "[exception]") TEST_CASE("Test REE-TEE isolation: IROM-R1", "[exception]")
{ {
uint32_t *val = (uint32_t *)(SOC_IROM_LOW + 0x04); uint32_t *val = (uint32_t *)(SOC_IROM_LOW + 0x04);
TEST_ASSERT_EQUAL(0, *val); TEST_ASSERT_EQUAL(0, *val);
@@ -178,14 +193,14 @@ TEST_CASE("Test REE-TEE isolation: IROM (R1)", "[exception]")
} }
/* TEE IROM region */ /* TEE IROM region */
TEST_CASE("Test REE-TEE isolation: IROM (W1)", "[exception]") TEST_CASE("Test REE-TEE isolation: IROM-W1", "[exception]")
{ {
*(uint32_t *)(SOC_IROM_LOW + 0x04) = 0xbadc0de; *(uint32_t *)(SOC_IROM_LOW + 0x04) = 0xbadc0de;
TEST_FAIL_MESSAGE("Exception should have been generated"); TEST_FAIL_MESSAGE("Exception should have been generated");
} }
/* TEE DROM - REE IROM boundary */ /* TEE DROM - REE IROM boundary */
TEST_CASE("Test REE-TEE isolation: DROM (R1)", "[exception]") TEST_CASE("Test REE-TEE isolation: DROM-R1", "[exception]")
{ {
const uint32_t test_addr = ALIGN_DOWN_TO_MMU_PAGE_SIZE((uint32_t)&_instruction_reserved_start); const uint32_t test_addr = ALIGN_DOWN_TO_MMU_PAGE_SIZE((uint32_t)&_instruction_reserved_start);
uint32_t *val = (uint32_t *)(test_addr - 0x04); uint32_t *val = (uint32_t *)(test_addr - 0x04);
@@ -194,16 +209,9 @@ TEST_CASE("Test REE-TEE isolation: DROM (R1)", "[exception]")
} }
/* TEE DROM - REE IROM boundary */ /* TEE DROM - REE IROM boundary */
TEST_CASE("Test REE-TEE isolation: DROM (W1)", "[exception]") TEST_CASE("Test REE-TEE isolation: DROM-W1", "[exception]")
{ {
const uint32_t test_addr = ALIGN_DOWN_TO_MMU_PAGE_SIZE((uint32_t)&_instruction_reserved_start); const uint32_t test_addr = ALIGN_DOWN_TO_MMU_PAGE_SIZE((uint32_t)&_instruction_reserved_start);
*(uint32_t *)(test_addr - 0x04) = 0xbadc0de; *(uint32_t *)(test_addr - 0x04) = 0xbadc0de;
TEST_FAIL_MESSAGE("Exception should have been generated"); TEST_FAIL_MESSAGE("Exception should have been generated");
} }
/* SWDT/BOD Reset register */
TEST_CASE("Test REE-TEE isolation: SWDT/BOD (W)", "[exception]")
{
REG_WRITE(LP_ANALOG_PERI_LP_ANA_FIB_ENABLE_REG, 0);
TEST_FAIL_MESSAGE("Exception should have been generated");
}

77
components/esp_tee/test_apps/tee_test_fw/pytest_esp_tee_ut.py
View File

@@ -2,8 +2,6 @@
# SPDX-License-Identifier: Apache-2.0 # SPDX-License-Identifier: Apache-2.0
import re import re
from enum import Enum from enum import Enum
from typing import Dict
from typing import Tuple
import pytest import pytest
from pytest_embedded_idf import IdfDut from pytest_embedded_idf import IdfDut
@@ -11,7 +9,7 @@ from pytest_embedded_idf.utils import idf_parametrize
# ---------------- Pytest build parameters ---------------- # ---------------- Pytest build parameters ----------------
SUPPORTED_TARGETS = ['esp32c6', 'esp32h2'] SUPPORTED_TARGETS = ['esp32c6', 'esp32h2', 'esp32c5']
CONFIG_DEFAULT = [ CONFIG_DEFAULT = [
# 'config, target, markers', # 'config, target, markers',
@@ -34,28 +32,27 @@ CONFIG_ALL = [
# ---------------- Exception test-cases reasons ---------------- # ---------------- Exception test-cases reasons ----------------
TEE_VIOLATION_TEST_EXC_RSN: Dict[Tuple[str, str], str] = { TEE_VIOLATION_TEST_EXC_RSN: dict[str, str] = {
('Reserved', 'W1'): 'Store access fault', ('Reserved-W1'): 'Store access fault',
('Reserved', 'X1'): 'Instruction access fault', ('Reserved-X1'): 'Instruction access fault',
('IRAM', 'W1'): 'Store access fault', ('IRAM-W1'): 'Store access fault',
('IRAM', 'W2'): 'Store access fault', ('IRAM-W2'): 'Store access fault',
('DRAM', 'X1'): 'Instruction access fault', ('DRAM-X1'): 'Instruction access fault',
('DRAM', 'X2'): 'Instruction access fault', ('DRAM-X2'): 'Instruction access fault',
} }
REE_ISOLATION_TEST_EXC_RSN: Dict[Tuple[str, str], str] = { REE_ISOLATION_TEST_EXC_RSN: dict[str, str] = {
('DRAM', 'R1'): 'Load access fault', ('DRAM-R1'): 'Load access fault',
('DRAM', 'W1'): 'Store access fault', ('DRAM-W1'): 'Store access fault',
('IRAM', 'R1'): 'Load access fault', ('IRAM-R1'): 'Load access fault',
('IRAM', 'W1'): 'Store access fault', ('IRAM-W1'): 'Store access fault',
('IROM', 'R1'): 'Load access fault', ('IROM-R1'): 'Load access fault',
('IROM', 'W1'): 'Store access fault', ('IROM-W1'): 'Store access fault',
('DROM', 'R1'): 'Load access fault', ('DROM-R1'): 'Load access fault',
('DROM', 'W1'): 'Store access fault', ('DROM-W1'): 'Store access fault',
('SWDT/BOD', 'W'): 'Store access fault',
} }
TEE_APM_VIOLATION_EXC_CHK = ['eFuse', 'MMU', 'AES', 'HMAC', 'DS', 'SHA PCR', 'ECC PCR'] TEE_APM_VIOLATION_EXC_CHK = ['eFuse', 'MMU', 'AES', 'HMAC', 'DS', 'SHA PCR', 'ECC PCR', 'SWDT/BOD']
# ---------------- TEE default tests ---------------- # ---------------- TEE default tests ----------------
@@ -118,10 +115,12 @@ def test_esp_tee_aes_perf(dut: IdfDut) -> None:
def test_esp_tee_apm_violation(dut: IdfDut) -> None: def test_esp_tee_apm_violation(dut: IdfDut) -> None:
for check in TEE_APM_VIOLATION_EXC_CHK: for check in TEE_APM_VIOLATION_EXC_CHK:
dut.expect_exact('Press ENTER to see the list of tests') dut.expect_exact('Press ENTER to see the list of tests')
dut.write(f'"Test APM violation interrupt: {check}"') dut.write(f'"Test APM violation: {check}"')
exc = dut.expect(r'Core ([01]) panic\'ed \(([^)]+)\)', timeout=30).group(2).decode() exc = dut.expect(r'Core ([01]) panic\'ed \(([^)]+)\)', timeout=30).group(2).decode()
if dut.target == 'esp32h2' and check == 'eFuse': if dut.target == 'esp32c5' or (dut.target == 'esp32h2' and check == 'eFuse'):
exp_str = 'APM - Space exception' exp_str = 'APM - Space exception'
elif check == 'SWDT/BOD':
exp_str = 'Store access fault'
else: else:
exp_str = 'APM - Authority exception' exp_str = 'APM - Authority exception'
if exc != exp_str: if exc != exp_str:
@@ -148,13 +147,12 @@ def test_esp_tee_illegal_instruction(dut: IdfDut) -> None:
) )
def test_esp_tee_violation_checks(dut: IdfDut) -> None: def test_esp_tee_violation_checks(dut: IdfDut) -> None:
checks_list = TEE_VIOLATION_TEST_EXC_RSN checks_list = TEE_VIOLATION_TEST_EXC_RSN
for test in checks_list: for test, expected_exc in checks_list.items():
memory, access_type = test if expected_exc is None or dut.target == 'esp32c5':
expected_exc = checks_list[test] # TODO: Enable when TEE SRAM is partitioned as IRAM (RX) and DRAM (RW)
if expected_exc is None:
continue continue
dut.expect_exact('Press ENTER to see the list of tests') dut.expect_exact('Press ENTER to see the list of tests')
dut.write(f'"Test TEE-TEE violation: {memory} ({access_type})"') dut.write(f'"Test TEE-TEE violation: {test}"')
actual_exc = dut.expect(r'Core ([01]) panic\'ed \(([^)]+)\)', timeout=30).group(2).decode() actual_exc = dut.expect(r'Core ([01]) panic\'ed \(([^)]+)\)', timeout=30).group(2).decode()
if actual_exc != expected_exc: if actual_exc != expected_exc:
raise RuntimeError('Incorrect exception received!') raise RuntimeError('Incorrect exception received!')
@@ -167,13 +165,11 @@ def test_esp_tee_violation_checks(dut: IdfDut) -> None:
) )
def test_esp_tee_isolation_checks(dut: IdfDut) -> None: def test_esp_tee_isolation_checks(dut: IdfDut) -> None:
checks_list = REE_ISOLATION_TEST_EXC_RSN checks_list = REE_ISOLATION_TEST_EXC_RSN
for test in checks_list: for test, expected_exc in checks_list.items():
memory, access_type = test
expected_exc = checks_list[test]
if expected_exc is None: if expected_exc is None:
continue continue
dut.expect_exact('Press ENTER to see the list of tests') dut.expect_exact('Press ENTER to see the list of tests')
dut.write(f'"Test REE-TEE isolation: {memory} ({access_type})"') dut.write(f'"Test REE-TEE isolation: {test}"')
actual_exc = dut.expect(r'Core ([01]) panic\'ed \(([^)]+)\)', timeout=30).group(2).decode() actual_exc = dut.expect(r'Core ([01]) panic\'ed \(([^)]+)\)', timeout=30).group(2).decode()
if actual_exc != expected_exc: if actual_exc != expected_exc:
raise RuntimeError('Incorrect exception received!') raise RuntimeError('Incorrect exception received!')
@@ -215,6 +211,8 @@ def run_multiple_stages(dut: IdfDut, test_case_num: int, stages: int, api: TeeFl
flash_enc_enabled = dut.app.sdkconfig.get('SECURE_FLASH_ENC_ENABLED', True) flash_enc_enabled = dut.app.sdkconfig.get('SECURE_FLASH_ENC_ENABLED', True)
SOC_TEE_FLASH_OP_FAIL_FAULT = ['esp32c6', 'esp32h2']
for stage in range(1, stages + 1): for stage in range(1, stages + 1):
dut.write(str(test_case_num)) dut.write(str(test_case_num))
dut.expect(r'\s+\((\d+)\)\s+"([^"]+)"\r?\n', timeout=30) dut.expect(r'\s+\((\d+)\)\s+"([^"]+)"\r?\n', timeout=30)
@@ -222,7 +220,10 @@ def run_multiple_stages(dut: IdfDut, test_case_num: int, stages: int, api: TeeFl
if stage > 1: if stage > 1:
if api in {TeeFlashAccessApi.ESP_PARTITION_MMAP, TeeFlashAccessApi.SPI_FLASH_MMAP}: if api in {TeeFlashAccessApi.ESP_PARTITION_MMAP, TeeFlashAccessApi.SPI_FLASH_MMAP}:
if dut.target in SOC_TEE_FLASH_OP_FAIL_FAULT:
expect_panic_rsn(dut, 'Cache error') expect_panic_rsn(dut, 'Cache error')
else:
dut.expect(r'\[_ss_mmu_hal_map_region] Illegal flash access at\s+\S+\s*\|\s*\S+', timeout=10)
elif api in {TeeFlashAccessApi.ESP_PARTITION, TeeFlashAccessApi.ESP_FLASH}: elif api in {TeeFlashAccessApi.ESP_PARTITION, TeeFlashAccessApi.ESP_FLASH}:
op_index = stage - 2 op_index = stage - 2
curr_op = expected_ops[api][op_index] curr_op = expected_ops[api][op_index]
@@ -230,7 +231,10 @@ def run_multiple_stages(dut: IdfDut, test_case_num: int, stages: int, api: TeeFl
# NOTE: The esp_partition_read API handles both decrypted # NOTE: The esp_partition_read API handles both decrypted
# and plaintext reads. When flash encryption is enabled, # and plaintext reads. When flash encryption is enabled,
# it uses the MMU HAL instead of the SPI flash HAL. # it uses the MMU HAL instead of the SPI flash HAL.
if dut.target in SOC_TEE_FLASH_OP_FAIL_FAULT:
expect_panic_rsn(dut, 'Cache error') expect_panic_rsn(dut, 'Cache error')
else:
dut.expect(r'\[_ss_mmu_hal_map_region] Illegal flash access at\s+\S+\s*\|\s*\S+', timeout=10)
else: else:
match = dut.expect( match = dut.expect(
r'\[_ss_spi_flash_hal_(\w+)\] Illegal flash access at \s*(0x[0-9a-fA-F]+)', timeout=10 r'\[_ss_spi_flash_hal_(\w+)\] Illegal flash access at \s*(0x[0-9a-fA-F]+)', timeout=10
@@ -239,7 +243,10 @@ def run_multiple_stages(dut: IdfDut, test_case_num: int, stages: int, api: TeeFl
if not re.fullmatch(curr_op, actual_op): if not re.fullmatch(curr_op, actual_op):
raise RuntimeError(f'Unexpected flash operation: {actual_op} (expected: {curr_op})') raise RuntimeError(f'Unexpected flash operation: {actual_op} (expected: {curr_op})')
elif api == TeeFlashAccessApi.ESP_ROM_SPIFLASH: elif api == TeeFlashAccessApi.ESP_ROM_SPIFLASH:
if dut.target in SOC_TEE_FLASH_OP_FAIL_FAULT:
expect_panic_rsn(dut, 'APM - Authority exception') expect_panic_rsn(dut, 'APM - Authority exception')
else:
expect_panic_rsn(dut, 'APM - Space exception')
if stage != stages: if stage != stages:
dut.expect_exact('Press ENTER to see the list of tests.') dut.expect_exact('Press ENTER to see the list of tests.')
@@ -340,7 +347,7 @@ def test_esp_tee_flash_prot_esp_flash(dut: IdfDut) -> None:
@pytest.mark.generic @pytest.mark.generic
@idf_parametrize('config', ['ota'], indirect=['config']) @idf_parametrize('config', ['ota'], indirect=['config'])
@idf_parametrize('target', ['esp32c6', 'esp32h2'], indirect=['target']) @idf_parametrize('target', SUPPORTED_TARGETS, indirect=['target'])
def test_esp_tee_ota_negative(dut: IdfDut) -> None: def test_esp_tee_ota_negative(dut: IdfDut) -> None:
# start test # start test
dut.expect_exact('Press ENTER to see the list of tests') dut.expect_exact('Press ENTER to see the list of tests')
@@ -474,8 +481,8 @@ def test_esp_tee_ota_rollback(dut: IdfDut) -> None:
dut.expect('TEE otadata - Current image state: NEW', timeout=10) dut.expect('TEE otadata - Current image state: NEW', timeout=10)
dut.expect('Loaded TEE app from partition at offset 0x40000', timeout=10) dut.expect('Loaded TEE app from partition at offset 0x40000', timeout=10)
rst_rsn = dut.expect(r'rst:(0x[0-9A-Fa-f]+) \(([^)]+)\)', timeout=30).group(2).decode() rst_rsn = dut.expect(r'rst:(0x[0-9A-Fa-f]+) \(([^)]+)\)', timeout=30).group(2).decode()
# NOTE: LP_WDT_SYS is for ESP32-C6 case as bootloader fails to load the dummy TEE app # NOTE: LP_WDT_SYS (C6/H2) and RTC_WDT_SYS (C5) are expected as bootloader fails to load the dummy TEE app
if rst_rsn != 'LP_WDT_SYS': if rst_rsn not in {'LP_WDT_SYS', 'RTC_WDT_SYS'}:
raise RuntimeError('Incorrect reset reason observed after TEE image failure!') raise RuntimeError('Incorrect reset reason observed after TEE image failure!')
# after rollback # after rollback

1
components/esp_tee/test_apps/tee_test_fw/sdkconfig.defaults
View File

@@ -9,6 +9,7 @@ CONFIG_SECURE_TEE_TEST_MODE=y
# Setting partition table # Setting partition table
CONFIG_PARTITION_TABLE_SINGLE_APP_TEE=y CONFIG_PARTITION_TABLE_SINGLE_APP_TEE=y
CONFIG_PARTITION_TABLE_OFFSET=0xF000
# TEE IRAM size # TEE IRAM size
CONFIG_SECURE_TEE_IRAM_SIZE=0x8400 CONFIG_SECURE_TEE_IRAM_SIZE=0x8400