diff --git a/components/driver/test_apps/legacy_adc_driver/main/test_legacy_adc.c b/components/driver/test_apps/legacy_adc_driver/main/test_legacy_adc.c
index 56184ca16a..9f15c8fb58 100644
--- a/components/driver/test_apps/legacy_adc_driver/main/test_legacy_adc.c
+++ b/components/driver/test_apps/legacy_adc_driver/main/test_legacy_adc.c
@@ -79,7 +79,7 @@
 #define ADC_TEST_LOW_VAL         0
 #define ADC_TEST_LOW_THRESH      17
 
-#define ADC_TEST_HIGH_VAL        3430
+#define ADC_TEST_HIGH_VAL        3375
 #define ADC_TEST_HIGH_THRESH     200
 
 #elif CONFIG_IDF_TARGET_ESP32C61
diff --git a/components/esp_adc/test_apps/adc/main/test_common_adc.h b/components/esp_adc/test_apps/adc/main/test_common_adc.h
index 2bdfa9fe98..c218ed642d 100644
--- a/components/esp_adc/test_apps/adc/main/test_common_adc.h
+++ b/components/esp_adc/test_apps/adc/main/test_common_adc.h
@@ -99,7 +99,7 @@ extern "C" {
 #define ADC_TEST_LOW_VAL         0
 #define ADC_TEST_LOW_THRESH      17
 
-#define ADC_TEST_HIGH_VAL        3430
+#define ADC_TEST_HIGH_VAL        3375
 #define ADC_TEST_HIGH_VAL_DMA    4095
 #define ADC_TEST_HIGH_THRESH     200
 
diff --git a/tools/ci/dynamic_pipelines/templates/known_generate_test_child_pipeline_warnings.yml b/tools/ci/dynamic_pipelines/templates/known_generate_test_child_pipeline_warnings.yml
index 56e08dc009..e23c477367 100644
--- a/tools/ci/dynamic_pipelines/templates/known_generate_test_child_pipeline_warnings.yml
+++ b/tools/ci/dynamic_pipelines/templates/known_generate_test_child_pipeline_warnings.yml
@@ -14,7 +14,6 @@ no_runner_tags:
   - esp32c2,jtag,xtal_40mhz
   - esp32c3,flash_multi
   - esp32c3,sdcard_sdmode
-  - esp32c5,adc
   - esp32c5,jtag
   - esp32c5_2,generic_multi_device
   - esp32c6,jtag