Ivan Grokhotkov 6fda3df953 Merge branch 'bugfix/gpio_pin_bit_mask_truncation' into 'master' ...

driver: fix gpio pin_bit_mask truncation in sdspi_host and others

See merge request espressif/esp-idf!6746

2019-11-22 17:41:05 +08:00

..

test_adc2.c

examples: modify other examples and tests to use esp_netif instead of tcpip_adapter

2019-11-13 12:36:25 +01:00

test_gpio.c

fix unit test and examples for s2beta

2019-09-04 10:53:25 +10:00

test_i2c.c

feature(I2C): Add i2c hal support.

2019-11-21 20:34:07 +08:00

test_i2s.c

ci: disable unavailable tests for esp32s2beta

2019-09-04 10:53:25 +10:00

test_pcnt.c

fix unit test and examples for s2beta

2019-09-04 10:53:25 +10:00

test_pwm.c

driver: fix gpio pin_bit_mask truncation in sdspi_host and others

2019-11-18 13:42:22 +01:00

test_rmt.c

rmt: add HAL layer

2019-11-20 10:54:21 +08:00

test_rs485.c

ci: disable UTs for esp32s2beta without runners

2019-09-04 10:53:25 +10:00

test_spi_master.c

Merge branch 'master' into feature/esp32s2beta_merge

2019-10-15 14:59:27 +11:00

test_spi_param.c

ci: disable unavailable tests for esp32s2beta

2019-09-04 10:53:25 +10:00

test_spi_sio.c

ci: disable unavailable tests for esp32s2beta

2019-09-04 10:53:25 +10:00

test_spi_slave.c

ci: disable unavailable tests for esp32s2beta

2019-09-04 10:53:25 +10:00