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Makes app image booting more reliable (256-bit rather than 8-bit verification.) Some measurements, time to boot a 655KB app.bin file and run to app_main() execution. (All for rev 1 silicon, ie no 340ms spurious WDT delay.) 80MHz QIO mode: before = 300ms after = 140ms 40MHz DIO mode: before = 712ms after = 577ms 40MHz DIO mode, secure boot enabled before = 1380ms after = 934ms (Secure boot involves two ECC signature verifications (partition table, app) that take approx 300ms each with 80MHz CPU.)
Unit Test App
ESP-IDF unit tests are run using Unit Test App. The app can be built with the unit tests for a specific component. Unit tests are in test subdirectories of respective components.
Building Unit Test App
- Follow the setup instructions in the top-level esp-idf README.
- Set IDF_PATH environment variable to point to the path to the esp-idf top-level directory.
- Change into
tools/unit-test-appdirectory make menuconfigto configure the Unit Test App.make TEST_COMPONENTS=withTEST_COMPONENTSset to names of the components to be included in the test app. Ormake TESTS_ALL=1to build the test app with all the tests for components havingtestsubdirectory.- Follow the printed instructions to flash, or run
make flash.
Running Unit Tests
The unit test loader will prompt by showing a menu of available tests to run:
- Type a number to run a single test.
*to run all tests.[tagname]to run tests with "tag"![tagname]to run tests without "tag" (![ignore]is very useful as it runs all CI-enabled tests.)"test name here"to run test with given name