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nvs_flash: introduce write failures after each word written

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Previously the test bench would check failure recovery by introducing error after each write operation.
This makes checks a bit more extensive (and much longer) by failing after every word written. Surprisingly, this change didn't expose any bugs.
This commit is contained in:
Ivan Grokhotkov
2016-10-31 19:17:25 +08:00
parent 269332f473
commit 413f2c00f6
2 changed files with 16 additions and 14 deletions
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2
components/nvs_flash/test/spi_flash_emulation.h
View File

@@ -74,11 +74,11 @@ public:
return false; return false;
} }
for (size_t i = 0; i < size / 4; ++i) {
if (mFailCountdown != SIZE_MAX && mFailCountdown-- == 0) { if (mFailCountdown != SIZE_MAX && mFailCountdown-- == 0) {
return false; return false;
} }
for (size_t i = 0; i < size / 4; ++i) {
uint32_t sv = src[i]; uint32_t sv = src[i];
size_t pos = dstAddr / 4 + i; size_t pos = dstAddr / 4 + i;
uint32_t& dv = mData[pos]; uint32_t& dv = mData[pos];

14
components/nvs_flash/test/test_nvs.cpp
View File

@@ -894,7 +894,7 @@ TEST_CASE("test recovery from sudden poweroff", "[.][long][nvs][recovery][monkey
size_t totalOps = 0; size_t totalOps = 0;
int lastPercent = -1; int lastPercent = -1;
for (uint32_t errDelay = 4; ; ++errDelay) { for (uint32_t errDelay = 0; ; ++errDelay) {
INFO(errDelay); INFO(errDelay);
emu.randomize(seed); emu.randomize(seed);
emu.clearStats(); emu.clearStats();
@@ -903,23 +903,25 @@ TEST_CASE("test recovery from sudden poweroff", "[.][long][nvs][recovery][monkey
if (totalOps != 0) { if (totalOps != 0) {
int percent = errDelay * 100 / totalOps; int percent = errDelay * 100 / totalOps;
if (percent != lastPercent) { if (percent > lastPercent) {
printf("%d/%d (%d%%)\r\n", errDelay, static_cast<int>(totalOps), percent); printf("%d/%d (%d%%)\r\n", errDelay, static_cast<int>(totalOps), percent);
lastPercent = percent; lastPercent = percent;
} }
} }
TEST_ESP_OK(nvs_flash_init_custom(NVS_FLASH_SECTOR, NVS_FLASH_SECTOR_COUNT_MIN));
nvs_handle handle; nvs_handle handle;
TEST_ESP_OK(nvs_open("namespace1", NVS_READWRITE, &handle));
size_t count = iter_count; size_t count = iter_count;
if (nvs_flash_init_custom(NVS_FLASH_SECTOR, NVS_FLASH_SECTOR_COUNT_MIN) == ESP_OK) {
if (nvs_open("namespace1", NVS_READWRITE, &handle) == ESP_OK) {
if(test.doRandomThings(handle, gen, count) != ESP_ERR_FLASH_OP_FAIL) { if(test.doRandomThings(handle, gen, count) != ESP_ERR_FLASH_OP_FAIL) {
nvs_close(handle); nvs_close(handle);
break; break;
} }
nvs_close(handle); nvs_close(handle);
}
}
TEST_ESP_OK(nvs_flash_init_custom(NVS_FLASH_SECTOR, NVS_FLASH_SECTOR_COUNT_MIN)); TEST_ESP_OK(nvs_flash_init_custom(NVS_FLASH_SECTOR, NVS_FLASH_SECTOR_COUNT_MIN));
TEST_ESP_OK(nvs_open("namespace1", NVS_READWRITE, &handle)); TEST_ESP_OK(nvs_open("namespace1", NVS_READWRITE, &handle));
@@ -929,7 +931,7 @@ TEST_CASE("test recovery from sudden poweroff", "[.][long][nvs][recovery][monkey
CHECK(0); CHECK(0);
} }
nvs_close(handle); nvs_close(handle);
totalOps = emu.getEraseOps() + emu.getWriteOps(); totalOps = emu.getEraseOps() + emu.getWriteBytes() / 4;
} }
} }