From e8de889cda7d73e5c835a620bd043358de3e1d7e Mon Sep 17 00:00:00 2001 From: Chen Jichang Date: Mon, 30 Sep 2024 12:17:09 +0800 Subject: [PATCH] fix(parlio_rx): fix high failure rate of test with i2s input --- .../esp_driver_parlio/test_apps/parlio/main/test_parlio_rx.c | 2 +- 1 file changed, 1 insertion(+), 1 deletion(-) diff --git a/components/esp_driver_parlio/test_apps/parlio/main/test_parlio_rx.c b/components/esp_driver_parlio/test_apps/parlio/main/test_parlio_rx.c index d9d84cf005..cc454aa7b4 100644 --- a/components/esp_driver_parlio/test_apps/parlio/main/test_parlio_rx.c +++ b/components/esp_driver_parlio/test_apps/parlio/main/test_parlio_rx.c @@ -368,7 +368,7 @@ TEST_CASE("parallel_rx_unit_pulse_delimiter_test_via_i2s", "[parlio_rx]") { parlio_rx_pulse_delimiter_config_t pls_deli_cfg = { .valid_sig_line_id = TEST_VALID_SIG, - .sample_edge = PARLIO_SAMPLE_EDGE_POS, + .sample_edge = PARLIO_SAMPLE_EDGE_NEG, .bit_pack_order = PARLIO_BIT_PACK_ORDER_MSB, .eof_data_len = TEST_EOF_DATA_LEN, .timeout_ticks = 0,