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404e99965d1a221ebee1fed84fd2e9adb96f93ee
esp-idf/components/driver/test
History
michael 404e99965d spi_master: change high part config to allow transactions of 64 bytes
2018-08-16 18:55:09 +08:00
..
component.mk
Add SPI Master driver, example, test and docs
2017-01-06 14:20:32 +08:00
test_adc2.c
nvs_flash: Version compatibility check for nvs storage
2018-08-05 00:00:56 +00:00
test_gpio.c
driver(gpio) : Fixed the gpio related bug for release v3.1.
2018-07-12 20:19:02 +08:00
test_ledc.c
test: components/driver: ledc case
2018-06-19 02:00:42 +08:00
test_pcnt.c
bugfix: fix pcnt case "PCNT interrupt method test(control IO is high)"
2018-06-26 13:35:14 +08:00
test_rmt.c
test: add driver/rmt test case
2018-06-13 18:10:09 +08:00
test_sdmmc_sdspi_init.cpp
sdmmc, sdspi: fix initializers to be C++-compatible, add test
2018-04-23 14:35:13 +08:00
test_sigmadelta.c
test: driver/sigmadelta test case
2018-06-13 10:15:06 +08:00
test_spi_master.c
spi_master: change high part config to allow transactions of 64 bytes
2018-08-16 18:55:09 +08:00
test_spi_slave.c
fix(spi_slave): enable DMA clock when initialization.
2017-10-17 12:20:40 +08:00
test_timer.c
test: components/driver: timer case
2018-06-13 01:39:07 +00:00
test_uart.c
driver(uart): Fixed uart tx_empty interrupt wdt timeout bug.
2018-08-05 06:34:34 +00:00
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