forked from espressif/esp-idf
emmc: temporarily removed esp32 emmc ut_017
This commit is contained in:
@@ -1211,7 +1211,7 @@ UT_006:
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- UT_T1_SPIMODE
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- psram
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UT_017:
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.UT_017:
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extends: .unit_test_esp32_template
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tags:
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- ESP32_IDF
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@@ -194,7 +194,7 @@ TEST_CASE("SD clock dividers calculation", "[sd][test_env=UT_T1_SDMODE]")
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#endif //WITH_SD_TEST
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#if WITH_EMMC_TEST
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TEST_CASE("probe eMMC, slot 0, 4-bit", "[sd][test_env=EMMC]")
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TEST_CASE("probe eMMC, slot 0, 4-bit", "[sd][test_env=EMMC][ignore]")
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{
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//Test with SDR
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probe_sd(SDMMC_HOST_SLOT_0, 4, SDMMC_FREQ_PROBING, 0);
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@@ -204,7 +204,7 @@ TEST_CASE("probe eMMC, slot 0, 4-bit", "[sd][test_env=EMMC]")
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probe_sd(SDMMC_HOST_SLOT_0, 4, SDMMC_FREQ_HIGHSPEED, 1);
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}
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TEST_CASE("probe eMMC, slot 0, 8-bit", "[sd][test_env=EMMC]")
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TEST_CASE("probe eMMC, slot 0, 8-bit", "[sd][test_env=EMMC][ignore]")
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{
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//8-bit DDR not supported yet, test with SDR only
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probe_sd(SDMMC_HOST_SLOT_0, 8, SDMMC_FREQ_PROBING, 0);
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@@ -457,28 +457,28 @@ TEST_CASE("SDMMC test read/write with offset (SD slot 1)", "[sd][test_env=UT_T1_
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#endif //WITH_SD_TEST
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#if WITH_EMMC_TEST
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TEST_CASE("SDMMC performance test (eMMC slot 0, 4 line DDR)", "[sd][test_env=EMMC]")
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TEST_CASE("SDMMC performance test (eMMC slot 0, 4 line DDR)", "[sd][test_env=EMMC][ignore]")
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{
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sd_test_board_power_on();
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sd_test_rw_blocks(0, 4, test_read_write_performance);
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sd_test_board_power_off();
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}
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TEST_CASE("SDMMC test read/write with offset (eMMC slot 0, 4 line DDR)", "[sd][test_env=EMMC]")
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TEST_CASE("SDMMC test read/write with offset (eMMC slot 0, 4 line DDR)", "[sd][test_env=EMMC][ignore]")
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{
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sd_test_board_power_on();
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sd_test_rw_blocks(0, 4, test_read_write_with_offset);
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sd_test_board_power_off();
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}
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TEST_CASE("SDMMC performance test (eMMC slot 0, 8 line)", "[sd][test_env=EMMC]")
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TEST_CASE("SDMMC performance test (eMMC slot 0, 8 line)", "[sd][test_env=EMMC][ignore]")
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{
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sd_test_board_power_on();
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sd_test_rw_blocks(0, 8, test_read_write_performance);
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sd_test_board_power_off();
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}
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TEST_CASE("SDMMC test read/write with offset (eMMC slot 0, 8 line)", "[sd][test_env=EMMC]")
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TEST_CASE("SDMMC test read/write with offset (eMMC slot 0, 8 line)", "[sd][test_env=EMMC][ignore]")
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{
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sd_test_board_power_on();
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sd_test_rw_blocks(0, 8, test_read_write_with_offset);
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@@ -1205,42 +1205,42 @@ static void test_mmc_trim_blocks(sdmmc_card_t* card)
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#endif //SDMMC_FULL_ERASE_TEST
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}
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TEST_CASE("SDMMC trim test (eMMC slot 0, 4 line)", "[sd][test_env=EMMC]")
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TEST_CASE("SDMMC trim test (eMMC slot 0, 4 line)", "[sd][test_env=EMMC][ignore]")
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{
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sd_test_board_power_on();
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sd_test_rw_blocks(0, 4, test_mmc_trim_blocks);
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sd_test_board_power_off();
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}
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TEST_CASE("SDMMC trim test (eMMC slot 0, 8 line)", "[sd][test_env=EMMC]")
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TEST_CASE("SDMMC trim test (eMMC slot 0, 8 line)", "[sd][test_env=EMMC][ignore]")
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{
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sd_test_board_power_on();
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sd_test_rw_blocks(0, 8, test_mmc_trim_blocks);
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sd_test_board_power_off();
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}
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TEST_CASE("SDMMC discard test (eMMC slot 0, 4 line)", "[sd][test_env=EMMC]")
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TEST_CASE("SDMMC discard test (eMMC slot 0, 4 line)", "[sd][test_env=EMMC][ignore]")
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{
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sd_test_board_power_on();
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sd_test_rw_blocks(0, 4, test_mmc_discard_blocks);
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sd_test_board_power_off();
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}
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TEST_CASE("SDMMC discard test (eMMC slot 0, 8 line)", "[sd][test_env=EMMC]")
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TEST_CASE("SDMMC discard test (eMMC slot 0, 8 line)", "[sd][test_env=EMMC][ignore]")
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{
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sd_test_board_power_on();
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sd_test_rw_blocks(0, 8, test_mmc_discard_blocks);
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sd_test_board_power_off();
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}
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TEST_CASE("SDMMC sanitize test (eMMC slot 0, 4 line)", "[sd][test_env=EMMC]")
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TEST_CASE("SDMMC sanitize test (eMMC slot 0, 4 line)", "[sd][test_env=EMMC][ignore]")
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{
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sd_test_board_power_on();
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sd_test_rw_blocks(0, 4, test_mmc_sanitize_blocks);
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sd_test_board_power_off();
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}
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TEST_CASE("SDMMC sanitize test (eMMC slot 0, 8 line)", "[sd][test_env=EMMC]")
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TEST_CASE("SDMMC sanitize test (eMMC slot 0, 8 line)", "[sd][test_env=EMMC][ignore]")
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{
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sd_test_board_power_on();
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sd_test_rw_blocks(0, 8, test_mmc_sanitize_blocks);
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