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emmc: temporarily removed esp32 emmc ut_017

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This commit is contained in:
Armando
2023-04-18 10:07:54 +08:00
parent 2117b7a1dc
commit 96b3f52c4e
2 changed files with 13 additions and 13 deletions
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2
.gitlab/ci/target-test.yml
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@@ -1211,7 +1211,7 @@ UT_006:
- UT_T1_SPIMODE - UT_T1_SPIMODE
- psram - psram
UT_017: .UT_017:
extends: .unit_test_esp32_template extends: .unit_test_esp32_template
tags: tags:
- ESP32_IDF - ESP32_IDF

24
components/sdmmc/test/test_sd.c
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@@ -194,7 +194,7 @@ TEST_CASE("SD clock dividers calculation", "[sd][test_env=UT_T1_SDMODE]")
#endif //WITH_SD_TEST #endif //WITH_SD_TEST
#if WITH_EMMC_TEST #if WITH_EMMC_TEST
TEST_CASE("probe eMMC, slot 0, 4-bit", "[sd][test_env=EMMC]") TEST_CASE("probe eMMC, slot 0, 4-bit", "[sd][test_env=EMMC][ignore]")
{ {
//Test with SDR //Test with SDR
probe_sd(SDMMC_HOST_SLOT_0, 4, SDMMC_FREQ_PROBING, 0); probe_sd(SDMMC_HOST_SLOT_0, 4, SDMMC_FREQ_PROBING, 0);
@@ -204,7 +204,7 @@ TEST_CASE("probe eMMC, slot 0, 4-bit", "[sd][test_env=EMMC]")
probe_sd(SDMMC_HOST_SLOT_0, 4, SDMMC_FREQ_HIGHSPEED, 1); probe_sd(SDMMC_HOST_SLOT_0, 4, SDMMC_FREQ_HIGHSPEED, 1);
} }
TEST_CASE("probe eMMC, slot 0, 8-bit", "[sd][test_env=EMMC]") TEST_CASE("probe eMMC, slot 0, 8-bit", "[sd][test_env=EMMC][ignore]")
{ {
//8-bit DDR not supported yet, test with SDR only //8-bit DDR not supported yet, test with SDR only
probe_sd(SDMMC_HOST_SLOT_0, 8, SDMMC_FREQ_PROBING, 0); probe_sd(SDMMC_HOST_SLOT_0, 8, SDMMC_FREQ_PROBING, 0);
@@ -457,28 +457,28 @@ TEST_CASE("SDMMC test read/write with offset (SD slot 1)", "[sd][test_env=UT_T1_
#endif //WITH_SD_TEST #endif //WITH_SD_TEST
#if WITH_EMMC_TEST #if WITH_EMMC_TEST
TEST_CASE("SDMMC performance test (eMMC slot 0, 4 line DDR)", "[sd][test_env=EMMC]") TEST_CASE("SDMMC performance test (eMMC slot 0, 4 line DDR)", "[sd][test_env=EMMC][ignore]")
{ {
sd_test_board_power_on(); sd_test_board_power_on();
sd_test_rw_blocks(0, 4, test_read_write_performance); sd_test_rw_blocks(0, 4, test_read_write_performance);
sd_test_board_power_off(); sd_test_board_power_off();
} }
TEST_CASE("SDMMC test read/write with offset (eMMC slot 0, 4 line DDR)", "[sd][test_env=EMMC]") TEST_CASE("SDMMC test read/write with offset (eMMC slot 0, 4 line DDR)", "[sd][test_env=EMMC][ignore]")
{ {
sd_test_board_power_on(); sd_test_board_power_on();
sd_test_rw_blocks(0, 4, test_read_write_with_offset); sd_test_rw_blocks(0, 4, test_read_write_with_offset);
sd_test_board_power_off(); sd_test_board_power_off();
} }
TEST_CASE("SDMMC performance test (eMMC slot 0, 8 line)", "[sd][test_env=EMMC]") TEST_CASE("SDMMC performance test (eMMC slot 0, 8 line)", "[sd][test_env=EMMC][ignore]")
{ {
sd_test_board_power_on(); sd_test_board_power_on();
sd_test_rw_blocks(0, 8, test_read_write_performance); sd_test_rw_blocks(0, 8, test_read_write_performance);
sd_test_board_power_off(); sd_test_board_power_off();
} }
TEST_CASE("SDMMC test read/write with offset (eMMC slot 0, 8 line)", "[sd][test_env=EMMC]") TEST_CASE("SDMMC test read/write with offset (eMMC slot 0, 8 line)", "[sd][test_env=EMMC][ignore]")
{ {
sd_test_board_power_on(); sd_test_board_power_on();
sd_test_rw_blocks(0, 8, test_read_write_with_offset); sd_test_rw_blocks(0, 8, test_read_write_with_offset);
@@ -1205,42 +1205,42 @@ static void test_mmc_trim_blocks(sdmmc_card_t* card)
#endif //SDMMC_FULL_ERASE_TEST #endif //SDMMC_FULL_ERASE_TEST
} }
TEST_CASE("SDMMC trim test (eMMC slot 0, 4 line)", "[sd][test_env=EMMC]") TEST_CASE("SDMMC trim test (eMMC slot 0, 4 line)", "[sd][test_env=EMMC][ignore]")
{ {
sd_test_board_power_on(); sd_test_board_power_on();
sd_test_rw_blocks(0, 4, test_mmc_trim_blocks); sd_test_rw_blocks(0, 4, test_mmc_trim_blocks);
sd_test_board_power_off(); sd_test_board_power_off();
} }
TEST_CASE("SDMMC trim test (eMMC slot 0, 8 line)", "[sd][test_env=EMMC]") TEST_CASE("SDMMC trim test (eMMC slot 0, 8 line)", "[sd][test_env=EMMC][ignore]")
{ {
sd_test_board_power_on(); sd_test_board_power_on();
sd_test_rw_blocks(0, 8, test_mmc_trim_blocks); sd_test_rw_blocks(0, 8, test_mmc_trim_blocks);
sd_test_board_power_off(); sd_test_board_power_off();
} }
TEST_CASE("SDMMC discard test (eMMC slot 0, 4 line)", "[sd][test_env=EMMC]") TEST_CASE("SDMMC discard test (eMMC slot 0, 4 line)", "[sd][test_env=EMMC][ignore]")
{ {
sd_test_board_power_on(); sd_test_board_power_on();
sd_test_rw_blocks(0, 4, test_mmc_discard_blocks); sd_test_rw_blocks(0, 4, test_mmc_discard_blocks);
sd_test_board_power_off(); sd_test_board_power_off();
} }
TEST_CASE("SDMMC discard test (eMMC slot 0, 8 line)", "[sd][test_env=EMMC]") TEST_CASE("SDMMC discard test (eMMC slot 0, 8 line)", "[sd][test_env=EMMC][ignore]")
{ {
sd_test_board_power_on(); sd_test_board_power_on();
sd_test_rw_blocks(0, 8, test_mmc_discard_blocks); sd_test_rw_blocks(0, 8, test_mmc_discard_blocks);
sd_test_board_power_off(); sd_test_board_power_off();
} }
TEST_CASE("SDMMC sanitize test (eMMC slot 0, 4 line)", "[sd][test_env=EMMC]") TEST_CASE("SDMMC sanitize test (eMMC slot 0, 4 line)", "[sd][test_env=EMMC][ignore]")
{ {
sd_test_board_power_on(); sd_test_board_power_on();
sd_test_rw_blocks(0, 4, test_mmc_sanitize_blocks); sd_test_rw_blocks(0, 4, test_mmc_sanitize_blocks);
sd_test_board_power_off(); sd_test_board_power_off();
} }
TEST_CASE("SDMMC sanitize test (eMMC slot 0, 8 line)", "[sd][test_env=EMMC]") TEST_CASE("SDMMC sanitize test (eMMC slot 0, 8 line)", "[sd][test_env=EMMC][ignore]")
{ {
sd_test_board_power_on(); sd_test_board_power_on();
sd_test_rw_blocks(0, 8, test_mmc_sanitize_blocks); sd_test_rw_blocks(0, 8, test_mmc_sanitize_blocks);