test(adc): supported adc c5 calibration tests

This commit is contained in:
Armando
2024-12-17 16:04:47 +08:00
committed by Armando (Dou Yiwen)
parent b963c0f013
commit da5b859886
3 changed files with 6 additions and 7 deletions

View File

@@ -75,10 +75,10 @@
#define ADC_TEST_HIGH_THRESH 200
#elif CONFIG_IDF_TARGET_ESP32C5
#define ADC_TEST_LOW_VAL 2195
#define ADC_TEST_LOW_THRESH 200
#define ADC_TEST_LOW_VAL 0
#define ADC_TEST_LOW_THRESH 17
#define ADC_TEST_HIGH_VAL 4095
#define ADC_TEST_HIGH_VAL 3430
#define ADC_TEST_HIGH_THRESH 200
#elif CONFIG_IDF_TARGET_ESP32C61

View File

@@ -96,10 +96,10 @@ extern "C" {
#define ADC_TEST_HIGH_THRESH 200
#elif CONFIG_IDF_TARGET_ESP32C5
#define ADC_TEST_LOW_VAL 2169
#define ADC_TEST_LOW_THRESH 200
#define ADC_TEST_LOW_VAL 0
#define ADC_TEST_LOW_THRESH 17
#define ADC_TEST_HIGH_VAL 4095
#define ADC_TEST_HIGH_VAL 3430
#define ADC_TEST_HIGH_VAL_DMA 4095
#define ADC_TEST_HIGH_THRESH 200

View File

@@ -21,7 +21,6 @@ no_runner_tags:
- esp32c2,jtag,xtal_40mhz
- esp32c3,flash_multi
- esp32c3,sdcard_sdmode
- esp32c5,adc
- esp32c5,generic
- esp32c5,jtag
- esp32c5,wifi_ap