forked from espressif/esp-idf
test(adc): supported adc c5 calibration tests
This commit is contained in:
committed by
Armando (Dou Yiwen)
parent
b963c0f013
commit
da5b859886
@@ -75,10 +75,10 @@
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#define ADC_TEST_HIGH_THRESH 200
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#elif CONFIG_IDF_TARGET_ESP32C5
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#define ADC_TEST_LOW_VAL 2195
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#define ADC_TEST_LOW_THRESH 200
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#define ADC_TEST_LOW_VAL 0
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#define ADC_TEST_LOW_THRESH 17
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#define ADC_TEST_HIGH_VAL 4095
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#define ADC_TEST_HIGH_VAL 3430
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#define ADC_TEST_HIGH_THRESH 200
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#elif CONFIG_IDF_TARGET_ESP32C61
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@@ -96,10 +96,10 @@ extern "C" {
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#define ADC_TEST_HIGH_THRESH 200
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#elif CONFIG_IDF_TARGET_ESP32C5
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#define ADC_TEST_LOW_VAL 2169
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#define ADC_TEST_LOW_THRESH 200
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#define ADC_TEST_LOW_VAL 0
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#define ADC_TEST_LOW_THRESH 17
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#define ADC_TEST_HIGH_VAL 4095
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#define ADC_TEST_HIGH_VAL 3430
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#define ADC_TEST_HIGH_VAL_DMA 4095
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#define ADC_TEST_HIGH_THRESH 200
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@@ -21,7 +21,6 @@ no_runner_tags:
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- esp32c2,jtag,xtal_40mhz
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- esp32c3,flash_multi
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- esp32c3,sdcard_sdmode
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- esp32c5,adc
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- esp32c5,generic
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- esp32c5,jtag
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- esp32c5,wifi_ap
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