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fix(parlio_rx): fix high failure rate of test with i2s input

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This commit is contained in:
Chen Jichang
2024-09-30 12:17:09 +08:00
parent 0aa8c024a3
commit e8de889cda
1 changed files with 1 additions and 1 deletions
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components/esp_driver_parlio/test_apps/parlio/main/test_parlio_rx.c
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@@ -368,7 +368,7 @@ TEST_CASE("parallel_rx_unit_pulse_delimiter_test_via_i2s", "[parlio_rx]")
{
parlio_rx_pulse_delimiter_config_t pls_deli_cfg = {
.valid_sig_line_id = TEST_VALID_SIG,
.sample_edge = PARLIO_SAMPLE_EDGE_POS,
.sample_edge = PARLIO_SAMPLE_EDGE_NEG,
.bit_pack_order = PARLIO_BIT_PACK_ORDER_MSB,
.eof_data_len = TEST_EOF_DATA_LEN,
.timeout_ticks = 0,